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The proposed design compensates for V[Formula: see text] shifts in the TFT by employing a stacked capacitor configuration for threshold voltage detection. The simulated results show a percentage error in the OLED current of less than 0.04% for a maximum tensile and compressive strain of 0.3%. The circuit can suppress the error in OLED current to 1.83% for a V[Formula: see text] shift in the range of 0 V to 2.1 V, from the nominal 0.7 V, with an input data voltage of 15 V. Therefore, the proposed pixel circuit topology proves to be a highly reliable pixel architecture which can be effectively used in AMOLED displays. <\/jats:p>","DOI":"10.1142\/s0218126624502657","type":"journal-article","created":{"date-parts":[[2024,4,18]],"date-time":"2024-04-18T09:13:50Z","timestamp":1713431630000},"source":"Crossref","is-referenced-by-count":1,"title":["A Highly Reliable, Stacked-Capacitor, Voltage-Programmed Pixel Circuit Using a-IGZO TFTs for AMOLED Displays"],"prefix":"10.1142","volume":"33","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-2797-1679","authenticated-orcid":false,"given":"Divya","family":"Dubey","sequence":"first","affiliation":[{"name":"Department of Electronics and Communication Engineering, Indian Institute of Information Technology, Allahabad Prayagraj, Uttar Pradesh, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Akriti","family":"Srivastava","sequence":"additional","affiliation":[{"name":"Department of Electronics 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