{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,3]],"date-time":"2025-10-03T06:43:08Z","timestamp":1759473788873,"version":"build-2065373602"},"reference-count":29,"publisher":"World Scientific Pub Co Pte Ltd","issue":"18","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2025,12]]},"abstract":"<jats:p> Systolic array has emerged as a prominent architecture for Deep Neural Network (DNN) hardware accelerators, providing high-throughput and low-latency performance essential for deploying DNNs across diverse applications. However, when used in safety-critical applications, reliability assessment is mandatory to guarantee the correct behavior of DNN accelerators. While fault injection stands out as a well-established practical and robust method for reliability assessment, it is still a very time-consuming process. This paper addresses the time efficiency issue by introducing a novel hierarchical software-based hardware-aware fault injection strategy tailored for systolic array-based DNN accelerators. A Uniform Recurrent Equations system is used for software modeling of the systolic-array core of the DNN accelerators. The approach demonstrates a reduction of the fault injection time up to [Formula: see text] compared to the state-of-the-art hybrid (software\/hardware) hardware-aware fault injection frameworks and more than [Formula: see text] compared to RT-level fault injection frameworks without compromising the accuracy from the application level. Additionally, we introduce novel reliability metrics to better evaluate the robustness of a deep neural network system. The performance of the framework is studied on state-of-the-art DNN benchmarks. <\/jats:p>","DOI":"10.1142\/s0218126625430017","type":"journal-article","created":{"date-parts":[[2025,7,16]],"date-time":"2025-07-16T15:23:37Z","timestamp":1752679417000},"source":"Crossref","is-referenced-by-count":0,"title":["SAFFIRA A Framework for Assessing the Reliability of Systolic-Array DNN Accelerators"],"prefix":"10.1142","volume":"34","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-4812-5908","authenticated-orcid":false,"given":"Salvatore","family":"Pappalardo","sequence":"first","affiliation":[{"name":"Centrale Lyon, INSA Lyon, CNRS, Universit\u00e9 Claude Bernard Lyon 1, CPE Lyon, INL, UMR5270, Ecully, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5887-2598","authenticated-orcid":false,"given":"Nicolo\u2019","family":"Bellarmino","sequence":"additional","affiliation":[{"name":"Politecnico di Torino, DAUIN, Turin, Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1055-2696","authenticated-orcid":false,"given":"Bastien","family":"Deveautour","sequence":"additional","affiliation":[{"name":"Nantes Universite, CNRS, IETR, UMR 6164, F-44000, Nantes, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alberto","family":"Bosio","sequence":"additional","affiliation":[{"name":"Centrale Lyon, INSA Lyon, CNRS, Universit\u00e9 Claude Bernard Lyon 1, CPE Lyon, INL, UMR5270, Ecully, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6116-7339","authenticated-orcid":false,"given":"Mahdi","family":"Taheri","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology, Centre for Dependable Computing Systems, Tallinn, Estonia"},{"name":"Brandenburg University of Technology, dep.Computer Engineering, Cottbus, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6289-1521","authenticated-orcid":false,"given":"Masoud","family":"Daneshtalab","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology, Centre for Dependable Computing Systems, Tallinn, Estonia"},{"name":"Malardalen University, School of Innovation, Design and Engineering, Vasteras, Sweden"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8113-020X","authenticated-orcid":false,"given":"Jaan","family":"Raik","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology, Centre for Dependable Computing Systems, Tallinn, Estonia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8165-9592","authenticated-orcid":false,"given":"Maksim","family":"Jenihhin","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology, Centre for Dependable Computing Systems, Tallinn, Estonia"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2025,7,16]]},"reference":[{"volume-title":"27th IEEE European Test Symp. (ETS)","year":"2022","author":"Taheri M.","key":"S0218126625430017BIB001"},{"key":"S0218126625430017BIB002","doi-asserted-by":"publisher","DOI":"10.1145\/3638242"},{"key":"S0218126625430017BIB003","doi-asserted-by":"publisher","DOI":"10.1109\/ETS50041.2021.9465409"},{"key":"S0218126625430017BIB004","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS57882.2023.10139468"},{"key":"S0218126625430017BIB006","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED57927.2023.10129353"},{"key":"S0218126625430017BIB007","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2022.3217841"},{"key":"S0218126625430017BIB008","doi-asserted-by":"publisher","DOI":"10.1109\/VTS56346.2023.10140043"},{"key":"S0218126625430017BIB009","doi-asserted-by":"publisher","DOI":"10.1109\/DSN-W50199.2020.00014"},{"key":"S0218126625430017BIB010","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2022.3175930"},{"key":"S0218126625430017BIB011","doi-asserted-by":"publisher","DOI":"10.1145\/3295500.3356177"},{"key":"S0218126625430017BIB012","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE55969.2022.00036"},{"key":"S0218126625430017BIB013","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS57882.2023.10139704"},{"key":"S0218126625430017BIB014","doi-asserted-by":"publisher","DOI":"10.1109\/NAS.2018.8515692"},{"key":"S0218126625430017BIB015","doi-asserted-by":"publisher","DOI":"10.1109\/AICAS48895.2020.9073925"},{"key":"S0218126625430017BIB016","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-020-05920-2"},{"key":"S0218126625430017BIB017","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2020.2984992"},{"key":"S0218126625430017BIB018","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3012209"},{"key":"S0218126625430017BIB019","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED51717.2021.9424287"},{"key":"S0218126625430017BIB020","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2022.3159089"},{"key":"S0218126625430017BIB022","doi-asserted-by":"publisher","DOI":"10.1109\/DSD53832.2021.00072"},{"key":"S0218126625430017BIB023","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC52499.2021.9739383"},{"key":"S0218126625430017BIB024","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18074.2021.9586112"},{"key":"S0218126625430017BIB025","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD56317.2022.00086"},{"key":"S0218126625430017BIB027","doi-asserted-by":"publisher","DOI":"10.1145\/3126908.3126964"},{"key":"S0218126625430017BIB028","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS60919.2024.10508925"},{"key":"S0218126625430017BIB029","doi-asserted-by":"publisher","DOI":"10.1145\/773453.808184"},{"key":"S0218126625430017BIB030","doi-asserted-by":"publisher","DOI":"10.1145\/2799562.2799641"},{"key":"S0218126625430017BIB031","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090716"},{"key":"S0218126625430017BIB032","doi-asserted-by":"publisher","DOI":"10.1109\/LATS58125.2023.10154505"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126625430017","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,3]],"date-time":"2025-10-03T06:20:39Z","timestamp":1759472439000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/10.1142\/S0218126625430017"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,16]]},"references-count":29,"journal-issue":{"issue":"18","published-print":{"date-parts":[[2025,12]]}},"alternative-id":["10.1142\/S0218126625430017"],"URL":"https:\/\/doi.org\/10.1142\/s0218126625430017","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"type":"print","value":"0218-1266"},{"type":"electronic","value":"1793-6454"}],"subject":[],"published":{"date-parts":[[2025,7,16]]},"article-number":"2543001"}}