{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,2]],"date-time":"2022-04-02T23:51:21Z","timestamp":1648943481229},"reference-count":0,"publisher":"World Scientific Pub Co Pte Lt","issue":"03","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[1994,9]]},"abstract":"<jats:p> Different from the previous techniques which treated the folding and testing for PLAs as separate problems, this paper presents a new approach to combine the bipartite folding and testing for PLA\u2019s in the same procedure. Fewer silicon area than other existing comparable techniques is required to make the PLA testable. Experimental results show that this technique can reduce chip area, test length, test storage and time complexity. <\/jats:p>","DOI":"10.1142\/s0218126694000181","type":"journal-article","created":{"date-parts":[[2004,11,19]],"date-time":"2004-11-19T02:21:13Z","timestamp":1100830873000},"page":"305-317","source":"Crossref","is-referenced-by-count":0,"title":["COMBINING THE FOLDING AND TESTING FOR PROGRAMMABLE LOGIC ARRAYS"],"prefix":"10.1142","volume":"04","author":[{"given":"KAI-CHENG","family":"WEI","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan 70101, R.O.C"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"BIN-DA","family":"LIU","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan 70101, R.O.C"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2011,11,21]]},"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126694000181","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,7]],"date-time":"2019-08-07T02:46:42Z","timestamp":1565146002000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126694000181"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1994,9]]},"references-count":0,"journal-issue":{"issue":"03","published-online":{"date-parts":[[2011,11,21]]},"published-print":{"date-parts":[[1994,9]]}},"alternative-id":["10.1142\/S0218126694000181"],"URL":"https:\/\/doi.org\/10.1142\/s0218126694000181","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[1994,9]]}}}