{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T12:42:47Z","timestamp":1743511367630},"reference-count":0,"publisher":"World Scientific Pub Co Pte Lt","issue":"06","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[1997,12]]},"abstract":"<jats:p> The application of a radial basis function neural network (RBFN) for analog circuit fault isolation is presented. In this method the RBFN replaces the fault dictionary of analog circuits. The proposed method for analog circuit fault isolation takes the advantage of extremely fast training of RBFN compared to earlier neural network methods. A method is suggested to select centers and widths of RBF units. This selection procedure accounts for the component tolerances. The effectiveness of the RBFN for the fault isolation problem is demonstrated with an illustrative example. RBFN performed well even when the input patterns are drawn directly from the test node voltages of the analog circuit under consideration. A method is suggested to modify the RBF network in the event of occurrence of a new fault. The suggested modifications do not affect the previous training. <\/jats:p>","DOI":"10.1142\/s0218126697000462","type":"journal-article","created":{"date-parts":[[2003,10,15]],"date-time":"2003-10-15T20:35:19Z","timestamp":1066250119000},"page":"643-655","source":"Crossref","is-referenced-by-count":2,"title":["Radial Basis Function Networks for Analog Circuit Fault Isolation"],"prefix":"10.1142","volume":"07","author":[{"given":"N. S. C.","family":"Babu","sequence":"first","affiliation":[{"name":"Department of Electronics, 6, C.G.O. Complex, Lodhi Road,  New Delhi-110 003, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V. C.","family":"Prasad","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology, Hauzkhas,  New Delhi-110016, India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2011,11,21]]},"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126697000462","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,7]],"date-time":"2019-08-07T14:06:20Z","timestamp":1565186780000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126697000462"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1997,12]]},"references-count":0,"journal-issue":{"issue":"06","published-online":{"date-parts":[[2011,11,21]]},"published-print":{"date-parts":[[1997,12]]}},"alternative-id":["10.1142\/S0218126697000462"],"URL":"https:\/\/doi.org\/10.1142\/s0218126697000462","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[1997,12]]}}}