{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T09:44:51Z","timestamp":1648806291952},"reference-count":45,"publisher":"World Scientific Pub Co Pte Lt","issue":"01","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int. J. Image Grap."],"published-print":{"date-parts":[[2009,1]]},"abstract":"<jats:p> Texture analysis plays an important role in many tasks, ranging from remote sensing to medical imaging and query by content in large image data bases. The main difficulty of texture analysis in the past was the lack of adequate tools to characterize different scales of textures effectively. The development in multi-resolution analysis such as Gabor and wavelet transform help to overcome this difficulty. This paper describes the texture characterization system using (i) Wavelet Statistical Features (WSF) obtained from 3-level Discrete Wavelet Transformed (DWT) images, (ii) Wavelet Co-occurrence Features (WCF) of one level wavelet transformed images in detail. <\/jats:p>","DOI":"10.1142\/s0219467809003356","type":"journal-article","created":{"date-parts":[[2009,2,24]],"date-time":"2009-02-24T10:35:53Z","timestamp":1235471753000},"page":"77-100","source":"Crossref","is-referenced-by-count":0,"title":["TEXTURE CHARACTERIZATION USING WSFS AND WCFS"],"prefix":"10.1142","volume":"09","author":[{"given":"S.","family":"ARIVAZHAGAN","sequence":"first","affiliation":[{"name":"Department of Electronics and Communication Engineering, Mepco Schlenk Engineering College, Sivakasi, Tamil Nadu, 626 005, India"}]},{"given":"L.","family":"GANESAN","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, Alagappa Chettiar College of Engineering &amp; Technology, Karaikudi, Tamil Nadu, 630 004, India"}]}],"member":"219","published-online":{"date-parts":[[2011,11,20]]},"reference":[{"key":"rf1","doi-asserted-by":"publisher","DOI":"10.1109\/83.799885"},{"key":"rf2","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1978.4309944"},{"key":"rf3","doi-asserted-by":"publisher","DOI":"10.1109\/83.544570"},{"key":"rf4","volume-title":"Machine Vision","author":"Jain R.","year":"1995"},{"key":"rf5","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1973.4309314"},{"key":"rf6","first-page":"269","volume":"6","author":"Weszka J. 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