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This allows measurement of otherwise inaccessible correlation functions and can also be used as the starting point for data-initiated simulations. <\/jats:p>","DOI":"10.1142\/s0219525901000371","type":"journal-article","created":{"date-parts":[[2002,7,27]],"date-time":"2002-07-27T07:02:01Z","timestamp":1027753321000},"page":"481-490","source":"Crossref","is-referenced-by-count":6,"title":["APPLICATIONS OF SYNCHROTRON X-RAY MICROTOMOGRAPHY TO MESOSCALE  MATERIALS"],"prefix":"10.1142","volume":"04","author":[{"given":"G. T.","family":"SEIDLER","sequence":"first","affiliation":[{"name":"Physics Department, University of Washington, Seattle,  Washington 98195-1560, USA"}]},{"given":"L. J.","family":"ATKINS","sequence":"additional","affiliation":[{"name":"Physics Department, University of Washington, Seattle,  Washington 98195-1560, USA"}]},{"given":"E. 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