{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,11]],"date-time":"2025-10-11T01:35:57Z","timestamp":1760146557720},"reference-count":12,"publisher":"World Scientific Pub Co Pte Lt","issue":"03","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int. J. Wavelets Multiresolut Inf. Process."],"published-print":{"date-parts":[[2004,9]]},"abstract":"<jats:p> This paper presents a new method to monitor machining processes based on a combination of discrete wavelet transform (DWT) and statistical process control (SPC), called a multi-scale statistical approach. First, DWT is applied to decompose the sensor signal onto different scales. Next, the detection limits are formed for each decomposed signal components, called the sub-signals, using Shewhart control charts. Finally, by inverse wavelet transform of the threshold crossing points of the sub-signals, malfunctions can be detected. Based on a test on the tool condition monitoring in turning using acoustic emission (AE) signal, it is shown that the new method is effective and robust. <\/jats:p>","DOI":"10.1142\/s0219691304000548","type":"journal-article","created":{"date-parts":[[2004,8,30]],"date-time":"2004-08-30T11:36:17Z","timestamp":1093865777000},"page":"299-311","source":"Crossref","is-referenced-by-count":6,"title":["MONITORING MACHINING PROCESSES BASED ON DISCRETE WAVELET TRANSFORM AND STATISTICAL PROCESS CONTROL"],"prefix":"10.1142","volume":"02","author":[{"given":"XIAOLI","family":"LI","sequence":"first","affiliation":[{"name":"CERCIA, School of Computer Science, The University of Birmingham, Edgbaston, Birmingham, B15 2TT, UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"DU","sequence":"additional","affiliation":[{"name":"Department of Automation &amp;  Computer-Aided-Engineering, The Chinese University of Hong Kong,  Shatin, N.T., Hong Kong, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2011,11,21]]},"reference":[{"key":"rf1","volume-title":"Introduction to Statistical Quality Control","author":"Montgomery D. C.","year":"1996"},{"key":"rf3","doi-asserted-by":"crossref","first-page":"51","DOI":"10.1080\/00224065.1982.11978790","volume":"14","author":"Lucas J. M.","journal-title":"J. Qual. Tech."},{"key":"rf4","doi-asserted-by":"crossref","first-page":"283","DOI":"10.1080\/00224065.1995.11979608","volume":"27","author":"Runger G. C.","journal-title":"J. Qual. Tech."},{"key":"rf5","doi-asserted-by":"publisher","DOI":"10.1002\/qre.4680110203"},{"key":"rf6","doi-asserted-by":"publisher","DOI":"10.1109\/18.57199"},{"key":"rf7","first-page":"909","author":"Daubechies I.","journal-title":"Comm. Pure App. Math."},{"key":"rf8","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690440712"},{"key":"rf9","doi-asserted-by":"publisher","DOI":"10.1016\/S0890-6955(97)00020-5"},{"key":"rf10","first-page":"16","author":"Cody M. A.","journal-title":"Dr. Dobb's J."},{"key":"rf11","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1099-128X(199905\/08)13:3\/4<415::AID-CEM544>3.0.CO;2-8"},{"key":"rf12","doi-asserted-by":"publisher","DOI":"10.1016\/S0890-6955(01)00108-0"},{"key":"rf13","doi-asserted-by":"publisher","DOI":"10.1115\/1.3188750"}],"container-title":["International Journal of Wavelets, Multiresolution and Information Processing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0219691304000548","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,7]],"date-time":"2019-08-07T03:07:25Z","timestamp":1565147245000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0219691304000548"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2004,9]]},"references-count":12,"journal-issue":{"issue":"03","published-online":{"date-parts":[[2011,11,21]]},"published-print":{"date-parts":[[2004,9]]}},"alternative-id":["10.1142\/S0219691304000548"],"URL":"https:\/\/doi.org\/10.1142\/s0219691304000548","relation":{},"ISSN":["0219-6913","1793-690X"],"issn-type":[{"value":"0219-6913","type":"print"},{"value":"1793-690X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2004,9]]}}}