{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,22]],"date-time":"2025-11-22T16:51:38Z","timestamp":1763830298919},"reference-count":12,"publisher":"World Scientific Pub Co Pte Lt","issue":"01","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int. J. Wavelets Multiresolut Inf. Process."],"published-print":{"date-parts":[[2009,1]]},"abstract":"<jats:p> Al - Cu thin films were deposited by DC magnetron sputtering. The films are characterized by atomic force microscopy and its surface morphologies are analyzed by wavelet technique. Multiresolution signal decomposition wavelet technique was employed to extract the surface roughness from the AFM images of Al - Cu thin films. It is observed that the Al - Cu thin films exhibit higher surface roughness value with increasing deposition time. The calculated surface roughness of the thin films, using wavelet technique, is comparable with that of its experimental values. <\/jats:p>","DOI":"10.1142\/s0219691309002775","type":"journal-article","created":{"date-parts":[[2009,1,23]],"date-time":"2009-01-23T04:09:57Z","timestamp":1232683797000},"page":"59-74","source":"Crossref","is-referenced-by-count":1,"title":["WAVELET ANALYSIS OF SURFACE MORPHOLOGIES OF MAGNETRON SPUTTERED <font>Al<\/font>-<font>Cu<\/font> THIN FILMS"],"prefix":"10.1142","volume":"07","author":[{"given":"GAURAV","family":"BHATNAGAR","sequence":"first","affiliation":[{"name":"Department of Mathematics, Indian Institute of Technology Roorkee, Roorkee-247 667, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"JAYAGANTHAN","sequence":"additional","affiliation":[{"name":"Department of Metallurgical and Materials Engineering, Indian Institute of Technology Roorkee, Roorkee-247 667, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"BALASUBRAMANIAN","family":"RAMAN","sequence":"additional","affiliation":[{"name":"Department of Mathematics, Indian Institute of Technology Roorkee, Roorkee-247 667, India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2011,11,21]]},"reference":[{"key":"rf1","doi-asserted-by":"publisher","DOI":"10.1238\/Physica.Regular.069a00348"},{"key":"rf2","doi-asserted-by":"publisher","DOI":"10.1063\/1.365763"},{"key":"rf3","doi-asserted-by":"publisher","DOI":"10.1016\/0040-6090(83)90045-7"},{"key":"rf4","doi-asserted-by":"publisher","DOI":"10.1002\/cpa.3160410705"},{"key":"rf5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-97177-8_2"},{"key":"rf6","volume-title":"Wavelets: A Tutorial in Theory and Applications","author":"Chui C. K.","year":"1992"},{"key":"rf7","doi-asserted-by":"publisher","DOI":"10.1142\/S0219691304000585"},{"key":"rf8","doi-asserted-by":"publisher","DOI":"10.1142\/S0219691305000993"},{"key":"rf9","doi-asserted-by":"publisher","DOI":"10.1142\/S0219691307001744"},{"key":"rf10","doi-asserted-by":"publisher","DOI":"10.1109\/34.192463"},{"key":"rf11","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611970104"},{"key":"rf12","doi-asserted-by":"publisher","DOI":"10.1142\/S0219691307002051"}],"container-title":["International Journal of Wavelets, Multiresolution and Information Processing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0219691309002775","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,6]],"date-time":"2019-08-06T23:06:47Z","timestamp":1565132807000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0219691309002775"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,1]]},"references-count":12,"journal-issue":{"issue":"01","published-online":{"date-parts":[[2011,11,21]]},"published-print":{"date-parts":[[2009,1]]}},"alternative-id":["10.1142\/S0219691309002775"],"URL":"https:\/\/doi.org\/10.1142\/s0219691309002775","relation":{},"ISSN":["0219-6913","1793-690X"],"issn-type":[{"value":"0219-6913","type":"print"},{"value":"1793-690X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,1]]}}}