{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T20:13:26Z","timestamp":1648584806188},"reference-count":13,"publisher":"World Scientific Pub Co Pte Lt","issue":"02","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int. J. Inf. Acquisition"],"published-print":{"date-parts":[[2013,6]]},"abstract":"<jats:p> When kernel methods are applied to detect the defection, there is a need to select the training samples, because kernel methods are based on the statistical learning theory. To extract the defects, the pre-image is calculated. In this paper, a sampling algorithm based on the alignment is designed to improve the calculation efficiency, where kernel alignment can measure the similarity between different kernel functions and matrices. A local linear algorithm is proposed to calculate the pre-image. When obtain the 0\u20131 difference image, an algorithm is designed to determine whether there are defects. An algorithm is designed to calculate the center coordinates and the areas of defects in the 0\u20131 image. Using this method, the accuracy of detection can be improved, because the method can remove the effect from recovery errors. When using the algorithms on a data set of printing products, the experiment results show that the detection results are more accurately than using the difference matrix. <\/jats:p>","DOI":"10.1142\/s0219878913500125","type":"journal-article","created":{"date-parts":[[2013,9,5]],"date-time":"2013-09-05T08:13:00Z","timestamp":1378368780000},"page":"1350012","source":"Crossref","is-referenced-by-count":0,"title":["RESEARCH OF PRINTING QUALITY DETECTION BASED ON IMAGE RESTORATION"],"prefix":"10.1142","volume":"09","author":[{"given":"ZHIYING","family":"TAN","sequence":"first","affiliation":[{"name":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Changzhou 213164, P. R. China"},{"name":"School of Computer Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"MINZHOU","family":"LUO","sequence":"additional","affiliation":[{"name":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Changzhou 213164, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"YONG","family":"FENG","sequence":"additional","affiliation":[{"name":"Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 401122, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"XIAOMING","family":"ZHUANG","sequence":"additional","affiliation":[{"name":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Changzhou 213164, P. R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"XIAOBO","family":"SONG","sequence":"additional","affiliation":[{"name":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Changzhou 213164, P. R. 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