{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T16:00:27Z","timestamp":1762012827805,"version":"build-2065373602"},"reference-count":7,"publisher":"World Scientific Pub Co Pte Ltd","issue":"02","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Int. J. Semantic Computing"],"published-print":{"date-parts":[[2019,6]]},"abstract":"<jats:p>To counter manufacturing irregularities and ensure ASIC design integrity, it is essential that robust design verification methods are employed. It is possible to ensure such integrity using ASIC static timing analysis (STA) and machine learning. In this research, uniquely devised machine and statistical learning methods which quantify anomalous variations in Register Transfer Level (RTL) or Graphic Design System II (GDSII) format are discussed. To measure the variations in ASIC analysis data, the timing delays in relation to path electrical characteristics are explored. It is shown that semi-supervised learning techniques are powerful tools in characterizing variations within STA path data and have much potential for identifying anomalies in ASIC RTL and GDSII design data.<\/jats:p>","DOI":"10.1142\/s1793351x19400105","type":"journal-article","created":{"date-parts":[[2019,6,25]],"date-time":"2019-06-25T13:11:02Z","timestamp":1561468262000},"page":"229-244","source":"Crossref","is-referenced-by-count":3,"title":["ASIC STA Path Verification Using Semi-Supervised Learning"],"prefix":"10.1142","volume":"13","author":[{"given":"James","family":"Obert","sequence":"first","affiliation":[{"name":"Sandia National Laboratories, P. O. Box 5800, Albuquerque, NM 87185, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tom J.","family":"Mannos","sequence":"additional","affiliation":[{"name":"Sandia National Laboratories, P. O. Box 5800, Albuquerque, NM 87185, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2019,6,25]]},"reference":[{"key":"S1793351X19400105BIB001","doi-asserted-by":"publisher","DOI":"10.7551\/mitpress\/9780262033589.001.0001"},{"key":"S1793351X19400105BIB002","first-page":"247","volume-title":"Digital Design with RTL Design, Verilog and VHDL","author":"Vahid F.","year":"2010","edition":"2"},{"key":"S1793351X19400105BIB006","unstructured":"M. Brennan, in PERT and CPM: A Selected Bibliography (Council of Planning Librarians, Monticello, 1968), p. 1."},{"key":"S1793351X19400105BIB007","doi-asserted-by":"crossref","unstructured":"F. E. Croxton, D. J. Cowden and S. Klein, in Applied General Statistics (Pitman, 1968), p. 625.","DOI":"10.2307\/2284056"},{"key":"S1793351X19400105BIB008","first-page":"46, 243","volume-title":"The Fourier Transform and Its Applications","author":"Bracewell R.","year":"1965"},{"key":"S1793351X19400105BIB009","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9781139165495"},{"key":"S1793351X19400105BIB010","series-title":"Texts in Statistical Science","doi-asserted-by":"crossref","DOI":"10.1201\/b16018","volume-title":"Bayesian Data Analysis, Third Edn.","author":"Gelman A.","year":"2013"}],"container-title":["International Journal of Semantic Computing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S1793351X19400105","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,1,7]],"date-time":"2021-01-07T19:55:59Z","timestamp":1610049359000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S1793351X19400105"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":7,"journal-issue":{"issue":"02","published-online":{"date-parts":[[2019,6,25]]},"published-print":{"date-parts":[[2019,6]]}},"alternative-id":["10.1142\/S1793351X19400105"],"URL":"https:\/\/doi.org\/10.1142\/s1793351x19400105","relation":{},"ISSN":["1793-351X","1793-7108"],"issn-type":[{"type":"print","value":"1793-351X"},{"type":"electronic","value":"1793-7108"}],"subject":[],"published":{"date-parts":[[2019,6]]}}}