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Through extensive experiments, we highlight the inherent limitations of traditional models and underscore the compelling advantages offered by AutoML. Notably, we recognize AutoML\u2019s unique capability to discern varying degrees of uncertainty within printed patterns. The outcomes emphasize the prowess of Auto Machine Learning in improving the accuracy of printed image forensics, making it particularly promising for future research, especially given the tabular nature of the data and the imperative for a lightweight model suitable for embedded systems. <\/jats:p>","DOI":"10.1142\/s2196888824500088","type":"journal-article","created":{"date-parts":[[2024,3,15]],"date-time":"2024-03-15T13:46:52Z","timestamp":1710510412000},"page":"465-485","source":"Crossref","is-referenced-by-count":1,"title":["A Deep Analysis of Printed Image Forensics with Auto Machine Learning"],"prefix":"10.1142","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9936-6533","authenticated-orcid":false,"given":"Phu Q.","family":"Nguyen","sequence":"first","affiliation":[{"name":"School of Computer Science and Engineering, International University, Ho Chi Minh City, Vietnam"},{"name":"Vietnam National University, Ho Chi Minh City, Vietnam"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9943-5909","authenticated-orcid":false,"given":"Nhan Tam","family":"Dang","sequence":"additional","affiliation":[{"name":"School of Computer Science and Engineering, International University, Ho Chi Minh City, Vietnam"},{"name":"Vietnam National University, Ho Chi Minh City, Vietnam"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3743-0701","authenticated-orcid":false,"given":"An","family":"Mai","sequence":"additional","affiliation":[{"name":"School of Computer Science and Engineering, International University, Ho Chi Minh City, Vietnam"},{"name":"Vietnam National University, Ho Chi Minh City, Vietnam"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"219","published-online":{"date-parts":[[2024,4,17]]},"reference":[{"key":"S2196888824500088BIB002","doi-asserted-by":"publisher","DOI":"10.1109\/RIVF48685.2020.9140764"},{"key":"S2196888824500088BIB004","doi-asserted-by":"publisher","DOI":"10.2352\/ISSN.2169-4451.2002.18.1.art00055_1"},{"key":"S2196888824500088BIB005","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-11756-5_7"},{"key":"S2196888824500088BIB006","doi-asserted-by":"publisher","DOI":"10.1016\/j.forsciint.2014.11.030"},{"key":"S2196888824500088BIB007","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537996"},{"key":"S2196888824500088BIB008","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2011.2156789"},{"key":"S2196888824500088BIB009","doi-asserted-by":"publisher","DOI":"10.1117\/12.531944"},{"key":"S2196888824500088BIB010","doi-asserted-by":"publisher","DOI":"10.1002\/9781118897768.ch8"},{"key":"S2196888824500088BIB011","first-page":"5377","volume-title":"IEEE Int. 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