{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T06:34:45Z","timestamp":1648794885214},"reference-count":10,"publisher":"World Scientific Pub Co Pte Lt","issue":"05n06","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Surf. Rev. Lett."],"published-print":{"date-parts":[[2002,10]]},"abstract":"<jats:p> The Al and Ge molar fraction of a few surface atomic layers in AlGe binary alloys was calculated using Auger electron spectroscopy (AES) and the evaluation of the Auger electron matrix factor or the matrix correction. The electron backscattering correction factor (R) and the inelastic mean path (IMFP) were taken into account to calculate the matrix correction. The IMFP was obtained from experimental optical data and elastic peak electron spectroscopy (EPES) measurements. The electron backscattering correction factor was calculated using Monte Carlo simulations. The main sources of the uncertainty of the Al and Ge molar fraction of a few surface atomic layers in AlGe binary alloys is the uncertainty of Al IMFP. <\/jats:p>","DOI":"10.1142\/s0218625x02004268","type":"journal-article","created":{"date-parts":[[2002,9,19]],"date-time":"2002-09-19T10:56:13Z","timestamp":1032432973000},"page":"1709-1713","source":"Crossref","is-referenced-by-count":1,"title":["AlGe ALLOY COMPOSITION CALCULATED BY AUGER ELECTRON SPECTROSCOPY"],"prefix":"10.1142","volume":"09","author":[{"given":"M. P.","family":"HERN\u00c1NDEZ","sequence":"first","affiliation":[{"name":"Centro de Investigacin en Ciencia Aplicada y  Tecnolog\u00eda Avanzada del IPN, Km 14.5 Carretera Tampico-Puerto  Industrial Altamira, 89600, Altamira, Tamps., Mexico"}]},{"given":"J. L.","family":"PE\u00d1A","sequence":"additional","affiliation":[{"name":"Centro de Investigacin en Ciencia Aplicada y  Tecnolog\u00eda Avanzada del IPN, Km 14.5 Carretera Tampico-Puerto  Industrial Altamira, 89600, Altamira, Tamps., Mexico"}]},{"given":"C. F.","family":"ALONSO","sequence":"additional","affiliation":[{"name":"Facultad de F\u00edsica, Universidad de La Habana,  San L\u00e1zaro y L, Plaza, 10400, Ciudad de La Habana, Cuba"}]},{"given":"P.","family":"BARTOLO-P\u00c9REZ","sequence":"additional","affiliation":[{"name":"Departamento de F\u00edsica Aplicada, Centro de Investigaci\u00f3n y de Estudios Avanzados del IPN, M\u00e9rida, Apartado Postal 73 Cordemex, 97310, M\u00e9rida, Yuc., Mexico"}]},{"given":"M. H.","family":"FAR\u00cdAS","sequence":"additional","affiliation":[{"name":"Centro de Ciencias de la Materia Condensada de la, Universidad Nacional Aut\u00f3noma de M\u00e9xico, Apartado Postal 2681, Ensenada, BC, Mexico"}]}],"member":"219","published-online":{"date-parts":[[2012,4,8]]},"reference":[{"key":"p_1","doi-asserted-by":"publisher","DOI":"10.1002\/sia.740111107"},{"key":"p_2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.35.482"},{"key":"p_3","doi-asserted-by":"publisher","DOI":"10.1016\/0368-2048(90)87075-Y"},{"key":"p_6","doi-asserted-by":"publisher","DOI":"10.1016\/0039-6028(85)90460-1"},{"key":"p_7","doi-asserted-by":"publisher","DOI":"10.1016\/0039-6028(89)90735-8"},{"key":"p_8","doi-asserted-by":"publisher","DOI":"10.1088\/0031-8949\/39\/3\/019"},{"key":"p_9","doi-asserted-by":"publisher","DOI":"10.1016\/0039-6028(81)90382-4"},{"key":"p_10","doi-asserted-by":"publisher","DOI":"10.1016\/0039-6028(83)90791-4"},{"key":"p_11","doi-asserted-by":"publisher","DOI":"10.1002\/sia.963"},{"key":"p_12","doi-asserted-by":"publisher","DOI":"10.1063\/1.556035"}],"container-title":["Surface Review and Letters"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218625X02004268","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,7]],"date-time":"2019-08-07T12:52:12Z","timestamp":1565182332000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218625X02004268"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,10]]},"references-count":10,"journal-issue":{"issue":"05n06","published-online":{"date-parts":[[2012,4,8]]},"published-print":{"date-parts":[[2002,10]]}},"alternative-id":["10.1142\/S0218625X02004268"],"URL":"https:\/\/doi.org\/10.1142\/s0218625x02004268","relation":{},"ISSN":["0218-625X","1793-6667"],"issn-type":[{"value":"0218-625X","type":"print"},{"value":"1793-6667","type":"electronic"}],"subject":[],"published":{"date-parts":[[2002,10]]}}}