{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,27]],"date-time":"2025-06-27T07:29:01Z","timestamp":1751009341808,"version":"3.41.0"},"reference-count":11,"publisher":"Association for Computing Machinery (ACM)","issue":"2","license":[{"start":{"date-parts":[[1975,4,1]],"date-time":"1975-04-01T00:00:00Z","timestamp":165542400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["SIGMETRICS Perform. Eval. Rev."],"published-print":{"date-parts":[[1975,4]]},"abstract":"<jats:p>With the advent of third generation computing systems, the increase in complexity and power has reached a degree which exceeds the human ability to understand, to analyze, to predict, and to optimize system performance and reliability. The only method that can help is measurement. In defining measurement purposes, one has to define which measurable quantities in the system are significant and which may be ignored. But, at the present time, we do not know in general what is relevant in the measurements. For the sake of clarity, it is useful to define several levels of measurement- organizational level- computer center level- computing system level- job level- computer subsystem level.<\/jats:p>","DOI":"10.1145\/1041701.1041702","type":"journal-article","created":{"date-parts":[[2007,1,17]],"date-time":"2007-01-17T18:32:02Z","timestamp":1169058722000},"page":"1-12","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":2,"title":["Costoptimal reliability of data processing systems"],"prefix":"10.1145","volume":"4","author":[{"given":"Kornel","family":"Terplan","sequence":"first","affiliation":[{"name":"Stanford Linear Accelerator Center, Stanford, California"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[1975,4]]},"reference":[{"volume-title":"Evaluation and Measurement Techniques for Digital Computer Systems","year":"1973","author":"Drummond M. E.","key":"e_1_2_1_2_1"},{"volume-title":"Accuracy and Privacy in Computer Systems","year":"1973","author":"Martin J.","key":"e_1_2_1_3_1"},{"key":"e_1_2_1_4_1","first-page":"379","volume-title":"EUROCOMP Conference Proceedings","author":"Terplan K.","year":"1974"},{"volume-title":"Information Systems working paper 8-75","author":"Terplan K.","key":"e_1_2_1_5_1"},{"volume-title":"Reliable EDP Application Design","year":"1974","author":"Gilb T.","key":"e_1_2_1_7_1"},{"key":"e_1_2_1_8_1","first-page":"265","volume":"18","author":"Hamming R. W.","journal-title":"INFOTECH State of the Art Report"},{"key":"e_1_2_1_9_1","unstructured":"Bell T. E. Computer Performance Analysis: Measurement Objectives and Tools Santa Monica RAND (R-584-NASA\/PR).  Bell T. E. Computer Performance Analysis: Measurement Objectives and Tools Santa Monica RAND (R-584-NASA\/PR)."},{"key":"e_1_2_1_10_1","first-page":"477","volume":"18","author":"Beiser B.","journal-title":"INFOTECH State of the Art Report"},{"key":"e_1_2_1_11_1","first-page":"301","volume":"18","author":"Pinkerton I. M. M.","journal-title":"INFOTECH State of the Art Report"},{"first-page":"104","volume-title":"Proc. of the Eighth Hawaiian Information Conference on System Sciences","author":"Terplan K.","key":"e_1_2_1_12_1"},{"volume-title":"The Economics of Computers","year":"1969","author":"Sharpe W. F.","key":"e_1_2_1_13_1"}],"container-title":["ACM SIGMETRICS Performance Evaluation Review"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1041701.1041702","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1041701.1041702","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T21:14:58Z","timestamp":1750281298000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1041701.1041702"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1975,4]]},"references-count":11,"journal-issue":{"issue":"2","published-print":{"date-parts":[[1975,4]]}},"alternative-id":["10.1145\/1041701.1041702"],"URL":"https:\/\/doi.org\/10.1145\/1041701.1041702","relation":{},"ISSN":["0163-5999"],"issn-type":[{"type":"print","value":"0163-5999"}],"subject":[],"published":{"date-parts":[[1975,4]]},"assertion":[{"value":"1975-04-01","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}