{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:54:59Z","timestamp":1750308899772,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":11,"publisher":"ACM","license":[{"start":{"date-parts":[[2005,4,17]],"date-time":"2005-04-17T00:00:00Z","timestamp":1113696000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2005,4,17]]},"DOI":"10.1145\/1057661.1057668","type":"proceedings-article","created":{"date-parts":[[2005,8,3]],"date-time":"2005-08-03T08:31:47Z","timestamp":1123057907000},"page":"13-19","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Physical limitations on the bit-rate of on-chip interconnects"],"prefix":"10.1145","author":[{"given":"Noha","family":"Mahmoud","sequence":"first","affiliation":[{"name":"University of Illinois at Chicago"}]},{"given":"Maged","family":"Ghoneima","sequence":"additional","affiliation":[{"name":"Northwestern University"}]},{"given":"Yehia","family":"Ismail","sequence":"additional","affiliation":[{"name":"Northwestern University"}]}],"member":"320","published-online":{"date-parts":[[2005,4,17]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1147\/rd.462.0245"},{"key":"e_1_3_2_1_2_1","first-page":"24","volume-title":"Technology Conf. Proc.","author":"Bakoglu H.","year":"1999"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/5.362754"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/309847.310042"},{"key":"e_1_3_2_1_5_1","unstructured":"\"ELDO User's manual\" Mentor Graphics Corporation 2002.  \"ELDO User's manual\" Mentor Graphics Corporation 2002."},{"key":"e_1_3_2_1_6_1","unstructured":"\"FastHenry User's guide\" Massachusett's Institute of Technology Cambridge.  \"FastHenry User's guide\" Massachusett's Institute of Technology Cambridge."},{"key":"e_1_3_2_1_7_1","unstructured":"\"FastCap User's guide\" Massachusett's Institute of Technology Cambridge.  \"FastCap User's guide\" Massachusett's Institute of Technology Cambridge."},{"key":"e_1_3_2_1_8_1","unstructured":"J.D.Jackson \"Classical electrodynamics\" John Wiley & Sons Inc. New York USA 1962 pp. 199 1st edition.  J.D.Jackson \"Classical electrodynamics\" John Wiley & Sons Inc. New York USA 1962 pp. 199 1st edition."},{"key":"e_1_3_2_1_9_1","first-page":"193","article-title":"A parasitic extraction program for closely-spaced VLSI interconnects","author":"Powell S.","year":"1985","journal-title":"Proceeding of IEEE International Conference CAD"},{"issue":"2","key":"e_1_3_2_1_10_1","article-title":"Line-to-ground capacitance calculation for VLSI: A comparison","volume":"7","author":"Brake Erich","year":"1998","journal-title":"IEEE Transactions on Computer-Aided Design"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/378239.379045"}],"event":{"name":"GLSVLSI05: Great Lakes Symposium on VLSI 2005","sponsor":["ACM Association for Computing Machinery","SIGDA ACM Special Interest Group on Design Automation"],"location":"Chicago Illinois USA","acronym":"GLSVLSI05"},"container-title":["Proceedings of the 15th ACM Great Lakes symposium on VLSI"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1057661.1057668","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1057661.1057668","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T21:25:59Z","timestamp":1750281959000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1057661.1057668"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2005,4,17]]},"references-count":11,"alternative-id":["10.1145\/1057661.1057668","10.1145\/1057661"],"URL":"https:\/\/doi.org\/10.1145\/1057661.1057668","relation":{},"subject":[],"published":{"date-parts":[[2005,4,17]]},"assertion":[{"value":"2005-04-17","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}