{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,19]],"date-time":"2026-03-19T12:14:55Z","timestamp":1773922495470,"version":"3.50.1"},"publisher-location":"New York, New York, USA","reference-count":0,"publisher":"ACM Press","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2005]]},"DOI":"10.1145\/1062455.1062514","type":"proceedings-article","created":{"date-parts":[[2005,8,3]],"date-time":"2005-08-03T04:31:47Z","timestamp":1123043507000},"page":"284","source":"Crossref","is-referenced-by-count":312,"title":["Use of relative code churn measures to predict system defect density"],"prefix":"10.1145","author":[{"given":"Nachiappan","family":"Nagappan","sequence":"first","affiliation":[]},{"given":"Thomas","family":"Ball","sequence":"additional","affiliation":[]}],"member":"320","event":{"name":"the 27th international conference","location":"St. Louis, MO, USA","acronym":"ICSE '05","number":"27","sponsor":["ACM, Association for Computing Machinery","SIGSOFT, ACM Special Interest Group on Software Engineering"],"start":{"date-parts":[[2005,5,15]]},"end":{"date-parts":[[2005,5,21]]}},"container-title":["Proceedings of the 27th international conference on Software engineering  - ICSE '05"],"original-title":[],"link":[{"URL":"http:\/\/dl.acm.org\/ft_gateway.cfm?id=1062514&ftid=315701&dwn=1","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,12,16]],"date-time":"2016-12-16T02:16:23Z","timestamp":1481854583000},"score":1,"resource":{"primary":{"URL":"http:\/\/portal.acm.org\/citation.cfm?doid=1062455.1062514"}},"subtitle":[],"proceedings-subject":"Software engineering","short-title":[],"issued":{"date-parts":[[2005]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1145\/1062455.1062514","relation":{},"subject":[],"published":{"date-parts":[[2005]]}}}