{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:39:51Z","timestamp":1750307991202,"version":"3.41.0"},"reference-count":31,"publisher":"Association for Computing Machinery (ACM)","issue":"3","license":[{"start":{"date-parts":[[2004,6,7]],"date-time":"2004-06-07T00:00:00Z","timestamp":1086566400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["ACM Trans. Des. Autom. Electron. Syst."],"published-print":{"date-parts":[[2006,7]]},"abstract":"<jats:p>We propose a novel, nonsimulative probabilistic model for switching activity in sequential circuits, capturing both spatio-temporal correlations at internal nodes and higher order temporal correlations due to feedback. This model, which we refer to as the temporal dependency model (TDM), can be constructed from the logic structure and is shown to be a dynamic Bayesian network. Dynamic Bayesian networks are extremely powerful in modeling high order temporal, as well as spatial, correlations; TDM is an exact model for the underlying conditional independencies. The attractive feature of this graphical representation of the joint probability function is not only that it makes the dependency relationships amongst nodes explicit, but it also serves as a computational mechanism for probabilistic inference. We report average errors in switching probability of 0.006, with errors tightly distributed around mean error values, on ISCAS'89 benchmark circuits involving up to 10000 signals.<\/jats:p>","DOI":"10.1145\/1142980.1142990","type":"journal-article","created":{"date-parts":[[2006,7,25]],"date-time":"2006-07-25T14:14:26Z","timestamp":1153836866000},"page":"773-796","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":4,"title":["A stimulus-free graphical probabilistic switching model for sequential circuits using dynamic bayesian networks"],"prefix":"10.1145","volume":"11","author":[{"given":"Sanjukta","family":"Bhanja","sequence":"first","affiliation":[{"name":"University of South Florida, Tampa, FL"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Karthikeyan","family":"Lingasubramanian","sequence":"additional","affiliation":[{"name":"University of South Florida, Tampa, FL"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Ranganathan","sequence":"additional","affiliation":[{"name":"University of South Florida, Tampa, FL"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2004,6,7]]},"reference":[{"volume-title":"Proceedings of the IEEE\/ACM Design Automation Conference, 209--214","author":"Bhanja S.","key":"e_1_2_1_1_1"},{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.816144"},{"key":"e_1_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.837991"},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/136035.136043"},{"volume-title":"Proceedings of the ASIC Conference and Exhibit, 189--193","author":"Chen Z.","key":"e_1_2_1_5_1"},{"key":"e_1_2_1_6_1","unstructured":"Cowell R. G. David A. P. Lauritzen S. L. and Spiegelhalter D. J. 1999. Probabilistic Networks and Expert Systems. Springer Verlag New York.   Cowell R. G. David A. P. Lauritzen S. L. and Spiegelhalter D. J. 1999. Probabilistic Networks and Expert Systems. Springer Verlag New York."},{"key":"e_1_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.736184"},{"key":"e_1_2_1_8_1","doi-asserted-by":"crossref","first-page":"794","DOI":"10.1109\/43.137524","article-title":"Testability measures in pseudorandom testing","volume":"11","author":"Ercolani S.","year":"1992","journal-title":"IEEE Trans. CAD"},{"key":"e_1_2_1_9_1","unstructured":"Genie 2006. Graphical network interface. url: http:\/\/www.sis.pitt.edu\/genie\/genie2.  Genie 2006. Graphical network interface. url: http:\/\/www.sis.pitt.edu\/genie\/genie2."},{"volume-title":"Proceedings of the Design Automation Conference, 270--275","year":"1962","author":"Hachtel G. D.","key":"e_1_2_1_10_1"},{"volume-title":"Uncertainty in Artificial Intelligence","author":"Henrion M.","key":"e_1_2_1_11_1"},{"key":"e_1_2_1_12_1","unstructured":"Hugin. 2006. Hugin. url: http:\/\/www.hugin.com\/.  Hugin. 2006. Hugin. url: http:\/\/www.hugin.com\/."},{"key":"e_1_2_1_13_1","doi-asserted-by":"crossref","first-page":"89","DOI":"10.1016\/0169-2070(94)02003-8","article-title":"Dhugin: A computational system for dynamic time-sliced Bayesian networks","volume":"11","author":"Kjaerulff U.","year":"1995","journal-title":"Int. J. Forecasting"},{"key":"e_1_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/92.924063"},{"volume-title":"Proceedings of the European Design and Test Conference, 597--602","author":"Manich S.","key":"e_1_2_1_15_1"},{"key":"e_1_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/92.845899"},{"key":"e_1_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.681258"},{"key":"e_1_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.771179"},{"volume-title":"Proceedings of the Conference on Uncertainty in AI, 467--475","author":"Murphy K. P.","key":"e_1_2_1_19_1"},{"volume-title":"Proceedings of the 32nd ACM\/IEEE Design Automation Conference, 635--680","author":"Najm F.","key":"e_1_2_1_20_1"},{"key":"e_1_2_1_21_1","first-page":"2","article-title":"Transition density: A new measure of activity in digital circuits","volume":"12","author":"Najm F. N.","year":"1993","journal-title":"IEEE Trans. Comput. Aided Des. Integrated Circuits Syst."},{"volume-title":"Proceedings of the International Symposium on Low Power Electronics and Design, 158--163","author":"Nguyen D.","key":"e_1_2_1_22_1"},{"key":"e_1_2_1_23_1","doi-asserted-by":"crossref","unstructured":"Pearl J. 1988. Probabilistic Reasoning in Intelligent Systems: Network of Plausible Inference. Morgan Kaufmann San Fransisco Calif.   Pearl J. 1988. Probabilistic Reasoning in Intelligent Systems: Network of Plausible Inference. Morgan Kaufmann San Fransisco Calif.","DOI":"10.1016\/B978-0-08-051489-5.50008-4"},{"volume-title":"Proceedings of the International Symposium on Low Power Electronic Design, 86--89","author":"Ramani S.","key":"e_1_2_1_24_1"},{"key":"e_1_2_1_25_1","doi-asserted-by":"crossref","unstructured":"Rejimon T. and Bhanja S. 2006. A timing-aware probabilistic model for single-event-upset analysis. IEEE Trans. VLSI Syst. 10.1109\/TVLSI.2006.884165   Rejimon T. and Bhanja S. 2006. A timing-aware probabilistic model for single-event-upset analysis. IEEE Trans. VLSI Syst. 10.1109\/TVLSI.2006.884165","DOI":"10.1109\/TVLSI.2006.884165"},{"key":"e_1_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1145\/567270.567275"},{"volume-title":"Proceedings of the Design Automation Conference, 783--787","author":"Srivastava A.","key":"e_1_2_1_27_1"},{"volume-title":"Proceedings of the IEEE Custom Integrated Circuits Conference, 221--224","year":"1996","author":"Stamoulis G. I.","key":"e_1_2_1_28_1"},{"key":"e_1_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1109\/92.406998"},{"volume-title":"Proceedings of the 19th Annual Conference on Uncertainty on Artificial Intelligence, 624--631","author":"Yuan C.","key":"e_1_2_1_30_1"},{"volume-title":"Proceedings of the 34th Design Automation Conference. 10","author":"Yuan L. P.","key":"e_1_2_1_31_1"}],"container-title":["ACM Transactions on Design Automation of Electronic Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1142980.1142990","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1142980.1142990","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T15:06:16Z","timestamp":1750259176000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1142980.1142990"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2004,6,7]]},"references-count":31,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2006,7]]}},"alternative-id":["10.1145\/1142980.1142990"],"URL":"https:\/\/doi.org\/10.1145\/1142980.1142990","relation":{},"ISSN":["1084-4309","1557-7309"],"issn-type":[{"type":"print","value":"1084-4309"},{"type":"electronic","value":"1557-7309"}],"subject":[],"published":{"date-parts":[[2004,6,7]]},"assertion":[{"value":"2004-06-07","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}