{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:38:17Z","timestamp":1750307897214,"version":"3.41.0"},"reference-count":6,"publisher":"Association for Computing Machinery (ACM)","issue":"4","license":[{"start":{"date-parts":[[2007,9,1]],"date-time":"2007-09-01T00:00:00Z","timestamp":1188604800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["ACM Trans. Des. Autom. Electron. Syst."],"published-print":{"date-parts":[[2007,9]]},"abstract":"<jats:p>\n            Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance can result in improved test cost and test confidence. In this article, we analyze the testability in a new style of logic design based on\n            <jats:italic>Shannon's decomposition<\/jats:italic>\n            and\n            <jats:italic>supply gating<\/jats:italic>\n            . We observe that the tree structure of a logic circuit due to Shannon's decomposition makes it intrinsically more testable than a conventionally synthesized circuit, while at the same time providing an improvement in active power. We have analyzed four different aspects of the testability of a circuit: a) IDDQ test sensitivity, b) test power during scan-based testing, c) test length (for both ATPG-generated deterministic and random patterns), and d) noise immunity. Simulation results on a set of MCNC benchmarks show promising results on all these aspects (an average improvement of 94% in IDDQ sensitivity, 50% in test power, 19% (21%) in test length for deterministic (random) patterns, and 50% in coupling noise immunity). We have also demonstrated that the new logic structure can improve parametric yield (6% on average) of a circuit under process variations when considering a bound on circuit leakage.\n          <\/jats:p>","DOI":"10.1145\/1278349.1278360","type":"journal-article","created":{"date-parts":[[2007,10,14]],"date-time":"2007-10-14T12:41:11Z","timestamp":1192365671000},"page":"47","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Low-Power and testable circuit synthesis using Shannon decomposition"],"prefix":"10.1145","volume":"12","author":[{"given":"Swaroop","family":"Ghosh","sequence":"first","affiliation":[{"name":"Purdue University, West Lafayette, Indiana"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Swarup","family":"Bhunia","sequence":"additional","affiliation":[{"name":"Purdue University, West Lafayette, Indiana"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kaushik","family":"Roy","sequence":"additional","affiliation":[{"name":"Purdue University, West Lafayette, Indiana"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2007,9]]},"reference":[{"key":"e_1_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065705"},{"volume-title":"Proceedings of the IEEE International Symposium on Compound Semiconductors. 221--225","year":"1984","author":"Brglez F.","key":"e_1_2_1_2_1"},{"key":"e_1_2_1_3_1","unstructured":"Bushnell M. L. and Agarwal V. D. 2000. Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits. Kluwer.  Bushnell M. L. and Agarwal V. D. 2000. Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits. Kluwer."},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2005.98"},{"key":"e_1_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.5555\/787267.787965"},{"key":"e_1_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/217474.217538"}],"container-title":["ACM Transactions on Design Automation of Electronic Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1278349.1278360","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1278349.1278360","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T14:47:29Z","timestamp":1750258049000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1278349.1278360"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,9]]},"references-count":6,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2007,9]]}},"alternative-id":["10.1145\/1278349.1278360"],"URL":"https:\/\/doi.org\/10.1145\/1278349.1278360","relation":{},"ISSN":["1084-4309","1557-7309"],"issn-type":[{"type":"print","value":"1084-4309"},{"type":"electronic","value":"1557-7309"}],"subject":[],"published":{"date-parts":[[2007,9]]},"assertion":[{"value":"2007-09-01","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}