{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:39:28Z","timestamp":1750307968560,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":13,"publisher":"ACM","license":[{"start":{"date-parts":[[2007,9,3]],"date-time":"2007-09-03T00:00:00Z","timestamp":1188777600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2007,9,3]]},"DOI":"10.1145\/1284480.1284570","type":"proceedings-article","created":{"date-parts":[[2012,10,11]],"date-time":"2012-10-11T15:35:23Z","timestamp":1349969723000},"page":"342-347","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["An optimized hybrid approach to provide fault detection and correction in SoCs"],"prefix":"10.1145","author":[{"given":"Leticia M. V.","family":"Bolzani","sequence":"first","affiliation":[{"name":"Politecnico di Torino, Torino, Italy"}]},{"given":"Paolo","family":"Bernardi","sequence":"additional","affiliation":[{"name":"Politecnico di Torino, Torino, Italy"}]},{"given":"Matteo Sonza","family":"Reorda","sequence":"additional","affiliation":[{"name":"Politecnico di Torino, Torino, Italy"}]}],"member":"320","published-online":{"date-parts":[[2007,9,3]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003776"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1975.6312842"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1985.231893"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.1676475"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/71.774911"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1980.234478"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2003.1181897"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.5555\/951947.951989"},{"key":"e_1_3_2_1_9_1","first-page":"26060","article-title":"Software-Implemented Hardware Fault Tolerance","volume":"0","author":"Gouloubeva O.","unstructured":"O. Gouloubeva , M. Rebaudengo , M. Sonza Reorda , M. Violante , \" Software-Implemented Hardware Fault Tolerance \", Springer Science + Business Media, LLC, New York (USA), ISBN : 0-387 - 26060 - 26069 , pages 228. O. Gouloubeva, M. Rebaudengo, M. Sonza Reorda, M. Violante, \"Software-Implemented Hardware Fault Tolerance\", Springer Science + Business Media, LLC, New York (USA), ISBN: 0-387-26060-9, pages 228.","journal-title":"Springer Science + Business Media, LLC, New York (USA), ISBN"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.15"},{"key":"e_1_3_2_1_11_1","unstructured":"http:\/\/www.eembc.org 2004.  http:\/\/www.eembc.org 2004."},{"key":"e_1_3_2_1_12_1","first-page":"210","volume-title":"DFT99: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","author":"Rebaudengo M.","year":"1999","unstructured":"M. Rebaudengo , M. Sonza Reorda , M. Torchiano , M. Violante , \"Soft-error Detection through Software Fault-Tolerance techniques\" , DFT99: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems , pp. 210 -- 218 , Nov. 1999 . M. Rebaudengo, M. Sonza Reorda, M. Torchiano, M. Violante, \"Soft-error Detection through Software Fault-Tolerance techniques\", DFT99: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 210--218, Nov. 1999."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2007.8"}],"event":{"name":"SBCCI07: 20th Symposium on Integrated Circuits and System Design","sponsor":["ACM Association for Computing Machinery","SIGDA ACM Special Interest Group on Design Automation"],"location":"Copacabana Rio de Janeiro","acronym":"SBCCI07"},"container-title":["Proceedings of the 20th annual conference on Integrated circuits and systems design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1284480.1284570","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1284480.1284570","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T14:58:15Z","timestamp":1750258695000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1284480.1284570"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,9,3]]},"references-count":13,"alternative-id":["10.1145\/1284480.1284570","10.1145\/1284480"],"URL":"https:\/\/doi.org\/10.1145\/1284480.1284570","relation":{},"subject":[],"published":{"date-parts":[[2007,9,3]]},"assertion":[{"value":"2007-09-03","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}