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However, another phenomenon has often been observed\u2014the failure rate of a software product following its release decreases with time even if no bugs are corrected. In this article we present a simple model to represent this phenomenon. We introduce the concept of initial transient failure rate of the product and assume that it decays with a factor \u03b1 per unit time thereby increasing the product reliability with time. When the transient failure rate decays away, the product displays a steady state failure rate. We discuss how the parameters in this model\u2014initial transient failure rate, decay factor, and steady state failure rate\u2014can be determined from the failure and sales data of a product. We also describe how, using the model, we can determine the product stabilization time\u2014a product quality metric that describes how long it takes a product to reach close to its stable failure rate. We provide many examples where this model has been applied to data from released products.<\/jats:p>","DOI":"10.1145\/13487689.13487690","type":"journal-article","created":{"date-parts":[[2008,8,27]],"date-time":"2008-08-27T11:56:36Z","timestamp":1219838196000},"page":"1-20","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":5,"title":["Post-release reliability growth in software products"],"prefix":"10.1145","volume":"17","author":[{"given":"Pankaj","family":"Jalote","sequence":"first","affiliation":[{"name":"Indian Institute of Technology, Delhi, New Delhi, India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Brendan","family":"Murphy","sequence":"additional","affiliation":[{"name":"Microsoft Research, Cambridge, UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vibhu Saujanya","family":"Sharma","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology, Kanpur, India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2008,8,25]]},"reference":[{"volume-title":"Proceedings of the 25th Fault Tolerant Computing Symposium (FTCS-25)","author":"Chillarege R.","key":"e_1_2_1_1_1","unstructured":"Chillarege , R. , Biyani , S. , and Rosenthal , J . 1995. Measurement of failure rate in widely distributed software . In Proceedings of the 25th Fault Tolerant Computing Symposium (FTCS-25) , 424--433. Chillarege, R., Biyani, S., and Rosenthal, J. 1995. Measurement of failure rate in widely distributed software. In Proceedings of the 25th Fault Tolerant Computing Symposium (FTCS-25), 424--433."},{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1996.536980"},{"key":"e_1_2_1_3_1","unstructured":"Falk M. Marohn F. Michel R. Hofmann D. and Macke M. 2006. A First Course on Time Series Analysis http:\/\/statistik.mathematik.uniwuerzburg.de\/timeseries\/.  Falk M. Marohn F. Michel R. Hofmann D. and Macke M. 2006. A First Course on Time Series Analysis http:\/\/statistik.mathematik.uniwuerzburg.de\/timeseries\/."},{"volume-title":"Software reliability modeling survey","author":"Farr W.","key":"e_1_2_1_4_1","unstructured":"Farr , W. 1996. Software reliability modeling survey . In Software Reliability Engineering, Editor: M. R. 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