{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,1,8]],"date-time":"2023-01-08T05:28:30Z","timestamp":1673155710847},"publisher-location":"New York, NY, USA","reference-count":0,"publisher":"ACM","isbn-type":[{"value":"9781605580920","type":"print"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,5,5]]},"DOI":"10.1145\/1366224","type":"proceedings","created":{"date-parts":[[2008,5,6]],"date-time":"2008-05-06T14:37:21Z","timestamp":1210084641000},"source":"Crossref","is-referenced-by-count":0,"title":["Proceedings of the 2008 workshop on Radiation effects and fault tolerance in nanometer technologies"],"prefix":"10.1145","member":"320","published-online":{"date-parts":[[2008,5,5]]},"event":{"name":"CF '08: Computing Frontiers Conference","location":"Ischia Italy","acronym":"CF '08","sponsor":["ACM Association for Computing Machinery","SIGMICRO ACM Special Interest Group on Microarchitectural Research and Processing"]},"container-title":[],"original-title":[],"deposited":{"date-parts":[[2023,1,8]],"date-time":"2023-01-08T01:40:59Z","timestamp":1673142059000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/proceedings\/10.1145\/1366224"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,5,5]]},"ISBN":["9781605580920"],"references-count":0,"alternative-id":["10.1145\/1366224"],"URL":"https:\/\/doi.org\/10.1145\/1366224","relation":{},"subject":[],"published":{"date-parts":[[2008,5,5]]}}}