{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,19]],"date-time":"2025-10-19T15:37:21Z","timestamp":1760888241539,"version":"3.41.0"},"reference-count":25,"publisher":"Association for Computing Machinery (ACM)","issue":"3","license":[{"start":{"date-parts":[[2008,8,1]],"date-time":"2008-08-01T00:00:00Z","timestamp":1217548800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["J. Emerg. Technol. Comput. Syst."],"published-print":{"date-parts":[[2008,8]]},"abstract":"<jats:p>\n            Flexible electronics fabricated on thin-film, lightweight, and bendable substrates (e.g., plastic) have great potential for novel applications in consumer electronics such as flexible displays, e-paper, and smart labels; however, the key elements, namely thin-film transistors (TFTs), for implementing flexible circuits often suffer from electrical instability. Therefore, thorough reliability analysis is critical for flexible circuit design to ensure that the circuit will operate reliably throughout its lifetime. In this article we propose a methodology for reliability simulation of hydrogenated amorphous silicon (a-Si:H) TFT circuits. We show that: (1) the threshold voltage (\n            <jats:italic>\n              V\n              <jats:sub>TH<\/jats:sub>\n            <\/jats:italic>\n            ) shift of a single TFT can be estimated by analyzing its operating conditions; and (2) the circuit lifetime can be predicted accordingly by using SPICE-like simulators with proper modeling. We also propose an algorithm to reduce the simulation time by orders of magnitude, with good prediction accuracy. To validate our analytical model and simulation methodology, we compare simulation results with the actual circuit measurements of an integrated a-Si:H TFT scan driver fabricated on a glass substrate and we demonstrate very good consistency.\n          <\/jats:p>","DOI":"10.1145\/1389089.1389092","type":"journal-article","created":{"date-parts":[[2008,8,27]],"date-time":"2008-08-27T11:56:36Z","timestamp":1219838196000},"page":"1-23","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":14,"title":["Reliability analysis for flexible electronics"],"prefix":"10.1145","volume":"4","author":[{"given":"Tsung-Ching","family":"Huang","sequence":"first","affiliation":[{"name":"University of California, Santa Barbara, CA"}]},{"given":"Kwang-Ting (Tim)","family":"Cheng","sequence":"additional","affiliation":[{"name":"University of California, Santa Barbara, CA"}]},{"given":"Huai-Yuan","family":"Tseng","sequence":"additional","affiliation":[{"name":"EOL\/ITRI, Taiwan, R.O.C"}]},{"given":"Chen-Pang","family":"Kung","sequence":"additional","affiliation":[{"name":"EOL\/ITRI, Taiwan, R.O.C"}]}],"member":"320","published-online":{"date-parts":[[2008,8,29]]},"reference":[{"volume-title":"Proceedings of the International Solid-State Circuit Conference (ISSCC)","author":"Boehm M.","key":"e_1_2_1_1_1"},{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1889\/1.2012644"},{"key":"e_1_2_1_3_1","unstructured":"Cadence. 2003. Reliability simulation in integrated circuit design. http:\/\/www.cadence.com\/whitepapers\/5082_ReliabilitySim_FNL_WP.pdf (last accessed Dec. 2007).  Cadence. 2003. Reliability simulation in integrated circuit design. http:\/\/www.cadence.com\/whitepapers\/5082_ReliabilitySim_FNL_WP.pdf (last accessed Dec. 2007)."},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2006.1696147"},{"key":"e_1_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1116\/1.2186654"},{"key":"e_1_2_1_6_1","doi-asserted-by":"crossref","unstructured":"Chen H.-C. Chiang K.-Y. Chen M.-C. Kung C.-P. and Hou W.-H. 2007. A-Si robust gate driver for 7.0-in WVGA LCD panel. Soc. Inf. Display Digest 222--225.  Chen H.-C. Chiang K.-Y. Chen M.-C. Kung C.-P. and Hou W.-H. 2007. A-Si robust gate driver for 7.0-in WVGA LCD panel. Soc. Inf. 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N. Choi S. C. Cho N. W. Jo S. H. Park K.-S. Moon T. Kim C.-D. and Chung I.-J. 2006. A-Si TFT integrated gate driver with AC-driven single pull-down structure. Soc. Inf. Display (SID) Digest 208--211.","DOI":"10.1889\/1.2433455"},{"key":"e_1_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.45.6806"},{"key":"e_1_2_1_16_1","doi-asserted-by":"crossref","unstructured":"Kuo Y. 2003. Thin Film Transistors: Materials and Processes Volume 1: Amorphous Thin-Film Transistors. Springer.  Kuo Y. 2003. Thin Film Transistors: Materials and Processes Volume 1: Amorphous Thin-Film Transistors. Springer.","DOI":"10.1007\/978-1-4615-0397-2_1"},{"key":"e_1_2_1_17_1","unstructured":"Karam M. Fikry W. Haddara H. and Ragai H. 2000. Implementation of hot-carrier reliability simulation in Eldo. Tech Rep. Mentor Graphics.  Karam M. Fikry W. Haddara H. and Ragai H. 2000. Implementation of hot-carrier reliability simulation in Eldo. Tech Rep. 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