{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:38:05Z","timestamp":1750307885293,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":9,"publisher":"ACM","license":[{"start":{"date-parts":[[2008,7,20]],"date-time":"2008-07-20T00:00:00Z","timestamp":1216512000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2008,7,20]]},"DOI":"10.1145\/1390817.1390820","type":"proceedings-article","created":{"date-parts":[[2008,7,22]],"date-time":"2008-07-22T13:46:39Z","timestamp":1216734399000},"page":"6-10","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":3,"title":["Predicting fault-prone modules based on metrics transitions"],"prefix":"10.1145","author":[{"given":"Yoshiki","family":"Higo","sequence":"first","affiliation":[{"name":"Osaka University"}]},{"given":"Kenji","family":"Murao","sequence":"additional","affiliation":[{"name":"Osaka University"}]},{"given":"Shinji","family":"Kusumoto","sequence":"additional","affiliation":[{"name":"Osaka University"}]},{"given":"Katsuro","family":"Inoue","sequence":"additional","affiliation":[{"name":"Osaka University"}]}],"member":"320","published-online":{"date-parts":[[2008,7,20]]},"reference":[{"unstructured":"CVS. http:\/\/ximbiot.com\/cvs\/wiki\/.  CVS. http:\/\/ximbiot.com\/cvs\/wiki\/.","key":"e_1_3_2_1_1_1"},{"unstructured":"FreeMind. http:\/\/freemind.sourceforge.net\/wiki\/index.php\/Main_Page.  FreeMind. http:\/\/freemind.sourceforge.net\/wiki\/index.php\/Main_Page.","key":"e_1_3_2_1_2_1"},{"unstructured":"Subversion http:\/\/subversion.tigris.org\/.  Subversion http:\/\/subversion.tigris.org\/.","key":"e_1_3_2_1_3_1"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_4_1","DOI":"10.1109\/32.544352"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_5_1","DOI":"10.1109\/32.295895"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_6_1","DOI":"10.1109\/TSE.2005.49"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_7_1","DOI":"10.1002\/j.1538-7305.1948.tb01338.x"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_8_1","DOI":"10.1109\/TSE.2003.1191795"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_9_1","DOI":"10.1109\/TSE.2005.63"}],"event":{"sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering"],"acronym":"ISSTA '08","name":"ISSTA '08: International Symposium on Software Testing and Analysis","location":"Seattle Washington"},"container-title":["Proceedings of the 2008 workshop on Defects in large software systems"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1390817.1390820","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1390817.1390820","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T14:47:11Z","timestamp":1750258031000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1390817.1390820"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,7,20]]},"references-count":9,"alternative-id":["10.1145\/1390817.1390820","10.1145\/1390817"],"URL":"https:\/\/doi.org\/10.1145\/1390817.1390820","relation":{},"subject":[],"published":{"date-parts":[[2008,7,20]]},"assertion":[{"value":"2008-07-20","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}