{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T12:11:18Z","timestamp":1763467878504,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":10,"publisher":"ACM","license":[{"start":{"date-parts":[[2008,6,8]],"date-time":"2008-06-08T00:00:00Z","timestamp":1212883200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","award":["2005-HJ-1314"],"award-info":[{"award-number":["2005-HJ-1314"]}],"id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2008,6,8]]},"DOI":"10.1145\/1391469.1391550","type":"proceedings-article","created":{"date-parts":[[2008,7,30]],"date-time":"2008-07-30T12:09:58Z","timestamp":1217419798000},"page":"313-318","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":42,"title":["Characterizing chip-multiprocessor variability-tolerance"],"prefix":"10.1145","author":[{"given":"Sebastian","family":"Herbert","sequence":"first","affiliation":[{"name":"Carnegie Mellon University, Pittsburgh, PA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Diana","family":"Marculescu","sequence":"additional","affiliation":[{"name":"Carnegie Mellon University, Pittsburgh, PA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2008,6,8]]},"reference":[{"key":"e_1_3_2_1_1_1"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/4.982424"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/1283780.1283792"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065752"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/1054907.1054914"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.5555\/1266366.1266729"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065588"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2005.1568738"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2007.913186"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.27"}],"event":{"name":"DAC '08: The 45th Annual Design Automation Conference 2008","sponsor":["The EDA Consortium","IEEE\/CASS\/CANDE\/CEDA","SIGDA ACM Special Interest Group on Design Automation"],"location":"Anaheim California","acronym":"DAC '08"},"container-title":["Proceedings of the 45th annual Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1391469.1391550","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1391469.1391550","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T13:58:04Z","timestamp":1750255084000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1391469.1391550"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,6,8]]},"references-count":10,"alternative-id":["10.1145\/1391469.1391550","10.1145\/1391469"],"URL":"https:\/\/doi.org\/10.1145\/1391469.1391550","relation":{},"subject":[],"published":{"date-parts":[[2008,6,8]]},"assertion":[{"value":"2008-06-08","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}