{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:37:19Z","timestamp":1750307839009,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":23,"publisher":"ACM","license":[{"start":{"date-parts":[[2008,6,8]],"date-time":"2008-06-08T00:00:00Z","timestamp":1212883200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2008,6,8]]},"DOI":"10.1145\/1391469.1391589","type":"proceedings-article","created":{"date-parts":[[2008,7,30]],"date-time":"2008-07-30T12:09:58Z","timestamp":1217419798000},"page":"462-467","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":12,"title":["A \"true\" electrical cell model for timing, noise, and power grid verification"],"prefix":"10.1145","author":[{"given":"Noel","family":"Menezes","sequence":"first","affiliation":[{"name":"Intel Corporation, Hillsboro, OR"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chandramouli","family":"Kashyap","sequence":"additional","affiliation":[{"name":"Intel Corporation, Hillsboro, OR"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chirayu","family":"Amin","sequence":"additional","affiliation":[{"name":"Intel Corporation, Hillsboro, OR"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2008,6,8]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775921"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2002.808448"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/996566.996745"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.506141"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775933"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382562"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2005.17"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146974"},{"key":"e_1_3_2_1_9_1","volume-title":"Feb.","author":"Veetil V.","year":"2007","unstructured":"V. Veetil , D. Sylvester , and D. Blaauw , \" Fast and accurate waveform analysis with current source models,\" TAU workshop presentation , Feb. 2007 . V. Veetil, D. Sylvester, and D. Blaauw, \"Fast and accurate waveform analysis with current source models,\" TAU workshop presentation, Feb. 2007."},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2007.358083"},{"key":"e_1_3_2_1_11_1","volume-title":"A nonlinear cell macromodel for digital applications,\" Proc. of ICCAD","author":"Kashyap C.","year":"2007","unstructured":"C. Kashyap , C. Amin , N. Menezes , and E. Chiprout , \" A nonlinear cell macromodel for digital applications,\" Proc. of ICCAD , 2007 . C. Kashyap, C. Amin, N. Menezes, and E. Chiprout, \"A nonlinear cell macromodel for digital applications,\" Proc. of ICCAD, 2007."},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/266021.266033"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.150"},{"key":"e_1_3_2_1_14_1","volume-title":"Advanced waveform models for the nanometer regime,\" TAU workshop presentation","author":"Nassif S. R.","year":"2004","unstructured":"S. R. Nassif and E. Acar , \" Advanced waveform models for the nanometer regime,\" TAU workshop presentation , 2004 . S. R. Nassif and E. Acar, \"Advanced waveform models for the nanometer regime,\" TAU workshop presentation, 2004."},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/240518.240635"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1145\/378239.378488"},{"key":"e_1_3_2_1_17_1","volume-title":"Feb.","author":"Dartu F.","year":"2005","unstructured":"F. Dartu , K. Killpack , C. Amin , and N. Menezes , \" Evaluating the factors influencing timing accuracy,\" TAU workshop presentation , Feb. 2005 . F. Dartu, K. Killpack, C. Amin, and N. Menezes, \"Evaluating the factors influencing timing accuracy,\" TAU workshop presentation, Feb. 2005."},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.331409"},{"key":"e_1_3_2_1_19_1","volume-title":"http:\/\/www.synopsys.com\/products\/solutions\/galaxy\/ccs\/cc_source.html","author":"CCS","year":"2005","unstructured":"\" CCS timing white paper,\" Composite Current Source, Synopsys, {online} , http:\/\/www.synopsys.com\/products\/solutions\/galaxy\/ccs\/cc_source.html , 2005 . \"CCS timing white paper,\" Composite Current Source, Synopsys, {online}, http:\/\/www.synopsys.com\/products\/solutions\/galaxy\/ccs\/cc_source.html, 2005."},{"key":"e_1_3_2_1_20_1","unstructured":"\"Delay calculation meets the nanometer era \" Cadence Technical Paper {online} http:\/\/www.cadence.com\/products\/digital_ic\/tech_info.aspx 2005.  \"Delay calculation meets the nanometer era \" Cadence Technical Paper {online} http:\/\/www.cadence.com\/products\/digital_ic\/tech_info.aspx 2005."},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.835136"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.806601"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065598"}],"event":{"name":"DAC '08: The 45th Annual Design Automation Conference 2008","sponsor":["The EDA Consortium","IEEE\/CASS\/CANDE\/CEDA","SIGDA ACM Special Interest Group on Design Automation"],"location":"Anaheim California","acronym":"DAC '08"},"container-title":["Proceedings of the 45th annual Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1391469.1391589","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1391469.1391589","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T13:58:04Z","timestamp":1750255084000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1391469.1391589"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,6,8]]},"references-count":23,"alternative-id":["10.1145\/1391469.1391589","10.1145\/1391469"],"URL":"https:\/\/doi.org\/10.1145\/1391469.1391589","relation":{},"subject":[],"published":{"date-parts":[[2008,6,8]]},"assertion":[{"value":"2008-06-08","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}