{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:37:19Z","timestamp":1750307839428,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":14,"publisher":"ACM","license":[{"start":{"date-parts":[[2008,6,8]],"date-time":"2008-06-08T00:00:00Z","timestamp":1212883200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2008,6,8]]},"DOI":"10.1145\/1391469.1391600","type":"proceedings-article","created":{"date-parts":[[2008,7,30]],"date-time":"2008-07-30T12:09:58Z","timestamp":1217419798000},"page":"516-521","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":4,"title":["Dose map and placement co-optimization for timing yield enhancement and leakage power reduction"],"prefix":"10.1145","author":[{"given":"Kwangok","family":"Jeong","sequence":"first","affiliation":[{"name":"Univ. of California at San Diego, La Jolla, CA"}]},{"given":"Andrew B.","family":"Kahng","sequence":"additional","affiliation":[{"name":"Univ. of California at San Diego, La Jolla, CA"}]},{"given":"Chul-Hong","family":"Park","sequence":"additional","affiliation":[{"name":"Univ. of California at San Diego, La Jolla, CA"}]},{"given":"Hailong","family":"Yao","sequence":"additional","affiliation":[{"name":"Univ. of California at San Diego, La Jolla, CA"}]}],"member":"320","published-online":{"date-parts":[[2008,6,8]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.5555\/996070.1009962"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/1118299.1118513"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.857313"},{"key":"e_1_3_2_1_4_1","unstructured":"http:\/\/wps2a.semi.org\/cms\/groups\/public\/documents\/membersonly\/van_schoot_presentation.pdf.  http:\/\/wps2a.semi.org\/cms\/groups\/public\/documents\/membersonly\/van_schoot_presentation.pdf."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1117\/12.537384"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1117\/12.474579"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1117\/12.600409"},{"key":"e_1_3_2_1_8_1","first-page":"63490G","volume-title":"SPIE Symp. on Photomask Technology","volume":"6349","author":"Jeewakhan N.","year":"2006","unstructured":"N. Jeewakhan , N. Shamma , S.- J. Choi et al., \"Application of dosemapper for 65-nm gate CD control: strategies and results,\" Proc . SPIE Symp. on Photomask Technology , vol. 6349 , 2006 , p. 63490G . N. Jeewakhan, N. Shamma, S.-J. Choi et al., \"Application of dosemapper for 65-nm gate CD control: strategies and results,\" Proc. SPIE Symp. on Photomask Technology, vol. 6349, 2006, p. 63490G."},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1117\/12.485337"},{"key":"e_1_3_2_1_10_1","unstructured":"http:\/\/www.asml.com\/  http:\/\/www.asml.com\/"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.771182"},{"key":"e_1_3_2_1_12_1","unstructured":"http:\/\/www.ilog.com\/products\/cplex\/  http:\/\/www.ilog.com\/products\/cplex\/"},{"key":"e_1_3_2_1_13_1","unstructured":"Synopsys PrimeTime. http:\/\/www.synopsys.com\/  Synopsys PrimeTime. http:\/\/www.synopsys.com\/"},{"key":"e_1_3_2_1_14_1","unstructured":"Cadence SOC Encounter. http:\/\/www.cadence.com\/  Cadence SOC Encounter. http:\/\/www.cadence.com\/"}],"event":{"name":"DAC '08: The 45th Annual Design Automation Conference 2008","sponsor":["The EDA Consortium","IEEE\/CASS\/CANDE\/CEDA","SIGDA ACM Special Interest Group on Design Automation"],"location":"Anaheim California","acronym":"DAC '08"},"container-title":["Proceedings of the 45th annual Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1391469.1391600","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1391469.1391600","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T13:58:04Z","timestamp":1750255084000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1391469.1391600"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,6,8]]},"references-count":14,"alternative-id":["10.1145\/1391469.1391600","10.1145\/1391469"],"URL":"https:\/\/doi.org\/10.1145\/1391469.1391600","relation":{},"subject":[],"published":{"date-parts":[[2008,6,8]]},"assertion":[{"value":"2008-06-08","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}