{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,1,9]],"date-time":"2023-01-09T05:15:02Z","timestamp":1673241302756},"publisher-location":"New York, NY, USA","reference-count":0,"publisher":"ACM","isbn-type":[{"value":"9781595939715","type":"print"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10,9]]},"DOI":"10.1145\/1414004","type":"proceedings","created":{"date-parts":[[2008,10,14]],"date-time":"2008-10-14T17:49:52Z","timestamp":1224006592000},"source":"Crossref","is-referenced-by-count":0,"title":["Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement"],"prefix":"10.1145","member":"320","published-online":{"date-parts":[[2008,10,9]]},"event":{"name":"ESEM '08: 2008 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement","location":"Kaiserslautern Germany","acronym":"ESEM '08","sponsor":["ACM Association for Computing Machinery","SIGSOFT ACM Special Interest Group on Software Engineering"]},"container-title":[],"original-title":[],"deposited":{"date-parts":[[2023,1,9]],"date-time":"2023-01-09T02:58:56Z","timestamp":1673233136000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/proceedings\/10.1145\/1414004"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10,9]]},"ISBN":["9781595939715"],"references-count":0,"alternative-id":["10.1145\/1414004"],"URL":"https:\/\/doi.org\/10.1145\/1414004","relation":{},"subject":[],"published":{"date-parts":[[2008,10,9]]}}}