{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:33:34Z","timestamp":1750307614154,"version":"3.41.0"},"reference-count":16,"publisher":"Association for Computing Machinery (ACM)","issue":"2","license":[{"start":{"date-parts":[[2009,3,1]],"date-time":"2009-03-01T00:00:00Z","timestamp":1235865600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["ACM Trans. Des. Autom. Electron. Syst."],"published-print":{"date-parts":[[2009,3]]},"abstract":"<jats:p>In general, fault dictionary is prevented from practical applications in fault diagnosis due to its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, some of them fail to bring down the size to an acceptable level, and others might not be able to handle today's million-gate circuits due to their high time and space complexity. In this article, an algorithm is presented to reduce the size of pass-fail dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.<\/jats:p>","DOI":"10.1145\/1497561.1497570","type":"journal-article","created":{"date-parts":[[2009,4,6]],"date-time":"2009-04-06T16:34:22Z","timestamp":1239035662000},"page":"1-14","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["Reducing fault dictionary size for million-gate large circuits"],"prefix":"10.1145","volume":"14","author":[{"given":"Yu-Ru","family":"Hong","sequence":"first","affiliation":[{"name":"Purdue University, West Lafayette, IN"}]},{"given":"Juinn-Dar","family":"Huang","sequence":"additional","affiliation":[{"name":"National Chiao Tung University, Hsinchu, Taiwan"}]}],"member":"320","published-online":{"date-parts":[[2009,4,7]]},"reference":[{"volume-title":"Proceedings of the IEEE International Conference on Computer Design. 480--485","author":"Arslan B.","key":"e_1_2_1_1_1"},{"volume-title":"Proceedings of the International Conference on Computer-Aided Design. 576--579","author":"Boppana V.","key":"e_1_2_1_2_1"},{"volume-title":"Proceedings of the International Symposium on Circuits and Systems. 695--698","author":"Brglez F.","key":"e_1_2_1_3_1"},{"volume-title":"Proceedings of the International Symposium on Circuits and Systems. 1929--1934","author":"Brglez F","key":"e_1_2_1_4_1"},{"key":"e_1_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1007\/BF00135341"},{"key":"e_1_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/12.543707"},{"key":"e_1_2_1_7_1","unstructured":"Cormen T. H. Leiserson C. E. Rivest R. L. and Stein C. 2003. Introduction to Algorithms. MIT Press.   Cormen T. H. Leiserson C. E. Rivest R. L. and Stein C. 2003. Introduction to Algorithms. MIT Press."},{"key":"e_1_2_1_8_1","unstructured":"Horowitz E. Sahni S. and Mehta D. 1995. Fundamentals of Data Structures in C++. W.H. Freeman and Company.   Horowitz E. Sahni S. and Mehta D. 1995. Fundamentals of Data Structures in C++. W.H. Freeman and Company."},{"key":"e_1_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1145\/309847.310029"},{"volume-title":"Tech. Rep. 12--93, Department of Electrical Engineering","year":"1993","author":"Lee H. K.","key":"e_1_2_1_10_1"},{"volume-title":"Proceedings of the Design Automation Conference. 336--340","author":"Lee H. K.","key":"e_1_2_1_11_1"},{"key":"e_1_2_1_12_1","first-page":"1169","article-title":"Dynamic fault detection and diagnosis using neural networks","volume":"2","author":"Li R.","year":"1990","journal-title":"Proceedings of the IEEE International Symposium on Intelligent Control."},{"volume-title":"Proceedings of the International Conference on Computer-Aided Design. 272--279","author":"Pomeranz I.","key":"e_1_2_1_13_1"},{"volume-title":"Proceedings of the International Conference on Computer-Aided Design. 508--511","author":"Ryan P. G.","key":"e_1_2_1_14_1"},{"key":"e_1_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/264995.264999"},{"volume-title":"Proceedings of the IEEE VLSI Test Symposium. 198--203","author":"Venkataraman S.","key":"e_1_2_1_16_1"}],"container-title":["ACM Transactions on Design Automation of Electronic Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1497561.1497570","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1497561.1497570","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T12:45:43Z","timestamp":1750250743000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1497561.1497570"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,3]]},"references-count":16,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2009,3]]}},"alternative-id":["10.1145\/1497561.1497570"],"URL":"https:\/\/doi.org\/10.1145\/1497561.1497570","relation":{},"ISSN":["1084-4309","1557-7309"],"issn-type":[{"type":"print","value":"1084-4309"},{"type":"electronic","value":"1557-7309"}],"subject":[],"published":{"date-parts":[[2009,3]]},"assertion":[{"value":"2007-06-01","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2008-12-01","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2009-04-07","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}