{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:35:00Z","timestamp":1750307700696,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":12,"publisher":"ACM","license":[{"start":{"date-parts":[[2009,8,19]],"date-time":"2009-08-19T00:00:00Z","timestamp":1250640000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2009,8,19]]},"DOI":"10.1145\/1594233.1594243","type":"proceedings-article","created":{"date-parts":[[2009,8,24]],"date-time":"2009-08-24T14:08:35Z","timestamp":1251122915000},"page":"33-38","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["Hybrid logical-statistical simulation with thermal and IR-drop mapping for degradation and variation prediction"],"prefix":"10.1145","author":[{"given":"Domenik","family":"Helms","sequence":"first","affiliation":[{"name":"OFFIS, D26121 Oldenburg, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kai","family":"Hylla","sequence":"additional","affiliation":[{"name":"OFFIS, D26121, Oldenburg, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wolfgang","family":"Nebel","sequence":"additional","affiliation":[{"name":"CvO Univerity, D26121, Oldenburg, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2009,8,19]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"Nanometer reliability","author":"Rittman D.","year":"2002","unstructured":"D. Rittman. Nanometer reliability, 2002."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.5555\/996070.1009943"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.5555\/646949.712735"},{"key":"e_1_3_2_1_4_1","volume-title":"Works. on Low Power Design Impact on Test and Reliability","author":"Helms D.","year":"2008","unstructured":"D. Helms, M. Hoyer, S. Rosinger, and W. Nebel. RT level makro modelling of leakage and delay under realistic PTV variation. In Works. on Low Power Design Impact on Test and Reliability, May 2008."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/1283780.1283814"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1007\/11847083_6"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.5555\/2391795.2391817"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/871506.871529"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2006.879797"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382594"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/1057661.1057670"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.825599"}],"event":{"name":"ISLPED'09: International Symposium on Low Power Electronics and Design","sponsor":["ACM Association for Computing Machinery","SIGDA ACM Special Interest Group on Design Automation"],"location":"San Fancisco CA USA","acronym":"ISLPED'09"},"container-title":["Proceedings of the 2009 ACM\/IEEE international symposium on Low power electronics and design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1594233.1594243","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1594233.1594243","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T13:30:01Z","timestamp":1750253401000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1594233.1594243"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,8,19]]},"references-count":12,"alternative-id":["10.1145\/1594233.1594243","10.1145\/1594233"],"URL":"https:\/\/doi.org\/10.1145\/1594233.1594243","relation":{},"subject":[],"published":{"date-parts":[[2009,8,19]]},"assertion":[{"value":"2009-08-19","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}