{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:33:09Z","timestamp":1750307589170,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":27,"publisher":"ACM","license":[{"start":{"date-parts":[[2009,10,11]],"date-time":"2009-10-11T00:00:00Z","timestamp":1255219200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2009,10,11]]},"DOI":"10.1145\/1629395.1629432","type":"proceedings-article","created":{"date-parts":[[2009,10,13]],"date-time":"2009-10-13T15:11:11Z","timestamp":1255446671000},"page":"261-270","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":7,"title":["Towards scalable reliability frameworks for error prone CMPs"],"prefix":"10.1145","author":[{"given":"Joseph","family":"Sloan","sequence":"first","affiliation":[{"name":"Coordinated Science Laboratory, University of Illinois, Urbana, IL, USA"}]},{"given":"Rakesh","family":"Kumar","sequence":"additional","affiliation":[{"name":"Coordinated Science Laboratory, University of Illinois, Urbana, IL, USA"}]}],"member":"320","published-online":{"date-parts":[[2009,10,11]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"International Technology Roadmap for Semiconductors 2005 http:\/\/public.itrs.net.  International Technology Roadmap for Semiconductors 2005 http:\/\/public.itrs.net."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2003.1225959"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/1255456.1255466"},{"volume-title":"NSF Workshop on Science of Power Management. {Online}. Available: http:\/\/scipm.cs.vt.edu\/Slides\/2.RakeshKumar.pdf","key":"e_1_3_2_1_4_1","unstructured":"Stochastic Processors (or processors that do not always compute correctly by design) , NSF Workshop on Science of Power Management. {Online}. Available: http:\/\/scipm.cs.vt.edu\/Slides\/2.RakeshKumar.pdf Stochastic Processors (or processors that do not always compute correctly by design), NSF Workshop on Science of Power Management. {Online}. Available: http:\/\/scipm.cs.vt.edu\/Slides\/2.RakeshKumar.pdf"},{"key":"e_1_3_2_1_5_1","first-page":"389","volume-title":"Modeling the effect of technology trends on the soft error rate of combinational logic","author":"Shivakumar P.","year":"2002","unstructured":"P. Shivakumar , M. Kistler , S. Keckler , D. Burger , and L. Alvisi , \" Modeling the effect of technology trends on the soft error rate of combinational logic ,\" 2002 , pp. 389 -- 398 . P. Shivakumar, M. Kistler, S. Keckler, D. Burger, and L. Alvisi, \"Modeling the effect of technology trends on the soft error rate of combinational logic,\" 2002, pp. 389--398."},{"key":"e_1_3_2_1_6_1","first-page":"29","article-title":"A systematic methodology to compute the architectural vulnerability factors for a high-performance microprocessor,\" in MICRO 36: Proceedings of the 36th annual IEEE\/ACM International Symposium on Microarchitecture. Washington, DC","author":"Mukherjee S. S.","year":"2003","unstructured":"S. S. Mukherjee , C. Weaver , J. Emer , S. K. Reinhardt , and T. Austin , \" A systematic methodology to compute the architectural vulnerability factors for a high-performance microprocessor,\" in MICRO 36: Proceedings of the 36th annual IEEE\/ACM International Symposium on Microarchitecture. Washington, DC , USA: IEEE Computer Society , 2003 , p. 29 . S. S. Mukherjee, C. Weaver, J. Emer, S. K. Reinhardt, and T. Austin, \"A systematic methodology to compute the architectural vulnerability factors for a high-performance microprocessor,\" in MICRO 36: Proceedings of the 36th annual IEEE\/ACM International Symposium on Microarchitecture. Washington, DC, USA: IEEE Computer Society, 2003, p. 29.","journal-title":"USA: IEEE Computer Society"},{"key":"e_1_3_2_1_7_1","volume-title":"Characterizing the effects of transient faults on a high-performance processor pipeline,\" in DSN '04: Proceedings of the 2004 International Conference on Dependable Systems and Networks.","author":"Wang N. J.","year":"2004","unstructured":"N. J. Wang , J. Quek , T. M. Rafacz , and S. J. patel , Characterizing the effects of transient faults on a high-performance processor pipeline,\" in DSN '04: Proceedings of the 2004 International Conference on Dependable Systems and Networks. Washington, DC, USA : IEEE Computer Society , 2004 , p. 61. N. J. Wang, J. Quek, T. M. Rafacz, and S. J. patel, Characterizing the effects of transient faults on a high-performance processor pipeline,\" in DSN '04: Proceedings of the 2004 International Conference on Dependable Systems and Networks. Washington, DC, USA: IEEE Computer Society, 2004, p. 61."},{"key":"e_1_3_2_1_8_1","first-page":"72","volume-title":"key opportunities for post-cmos era","author":"Ionescu A.","year":"2008","unstructured":"A. Ionescu , \"New functionality and ultra low power : key opportunities for post-cmos era ,\" April 2008 , pp. 72 -- 73 . A. Ionescu, \"New functionality and ultra low power: key opportunities for post-cmos era,\" April 2008, pp. 72--73."},{"issue":"1","key":"e_1_3_2_1_9_1","first-page":"4","article-title":"Carbon nanotube devices for nanoelectronics","volume":"323","author":"Tsukagoshi K.","year":"2002","unstructured":"K. Tsukagoshi , N. Yoneya , S. Uryu , Y. Aoyagi , A. Kanda , Y. Ootuka , and B. W. Alphenaar , \" Carbon nanotube devices for nanoelectronics ,\" Physica B: Condensed Matter , vol. 323 , no. 1 -- 4 , pp. 107 -- 114, 2002 , proceedings of the Tsukuba Symposium on Carbon Nanotube in Commemoration of the 10th Anniversary of its Discovery. K. Tsukagoshi, N. Yoneya, S. Uryu, Y. Aoyagi, A. Kanda, Y. Ootuka, and B. W. Alphenaar, \"Carbon nanotube devices for nanoelectronics,\" Physica B: Condensed Matter, vol. 323, no. 1--4, pp. 107 -- 114, 2002, proceedings of the Tsukuba Symposium on Carbon Nanotube in Commemoration of the 10th Anniversary of its Discovery.","journal-title":"Physica B: Condensed Matter"},{"issue":"9","key":"e_1_3_2_1_10_1","first-page":"11","article-title":"van Roosmalen and G. Zhang, \"Reliability challenges in the nanoelectronics era","volume":"46","author":"A","year":"2006","unstructured":"A . van Roosmalen and G. Zhang, \"Reliability challenges in the nanoelectronics era ,\" Microelectronics and Reliability , vol. 46 , no. 9 -- 11 , pp. 1403 -- 1414, 2006 , proceedings of the 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. Wuppertal, Germany 3rd-6th October 2006. A. van Roosmalen and G. Zhang, \"Reliability challenges in the nanoelectronics era,\"Microelectronics and Reliability, vol. 46, no. 9--11, pp. 1403 -- 1414, 2006, proceedings of the 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. Wuppertal, Germany 3rd-6th October 2006.","journal-title":"Microelectronics and Reliability"},{"key":"e_1_3_2_1_11_1","unstructured":"Predictive Technology Model Arizon State University School of Engineering. {Online}. Available: http:\/\/www.eas.asu.edu\/ ptm\/  Predictive Technology Model Arizon State University School of Engineering. {Online}. Available: http:\/\/www.eas.asu.edu\/ ptm\/"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147092"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"crossref","DOI":"10.1002\/047122460X","volume-title":"Reliability of Computer Systems and Networks: Fault Tolerance, Analysis, and Design","author":"Shooman M. L.","year":"2002","unstructured":"M. L. Shooman , Reliability of Computer Systems and Networks: Fault Tolerance, Analysis, and Design . New York, NY, USA : John Wiley &Sons, Inc., 2002 . M. L. Shooman, Reliability of Computer Systems and Networks: Fault Tolerance, Analysis, and Design. New York, NY, USA: John Wiley&Sons, Inc., 2002."},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1978.11111"},{"issue":"3","key":"e_1_3_2_1_15_1","first-page":"451","article-title":"Evaluation of software-implemented fault-tolerance (sift) approach in gracefully degradable multi-computer systems,\" Reliability","volume":"55","author":"Avresky D.","year":"2006","unstructured":"D. Avresky , S. Geoghegan , and Y. Varoglu , Evaluation of software-implemented fault-tolerance (sift) approach in gracefully degradable multi-computer systems,\" Reliability , IEEE Transactions on , vol. 55 , no. 3 , pp. 451 -- 457 , Sept. 2006 . D. Avresky, S. Geoghegan, and Y. Varoglu, Evaluation of software-implemented fault-tolerance (sift) approach in gracefully degradable multi-computer systems,\" Reliability, IEEE Transactions on, vol. 55, no. 3, pp. 451--457, Sept. 2006.","journal-title":"IEEE Transactions on"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1978.11113"},{"key":"e_1_3_2_1_17_1","first-page":"2000","article-title":"Diva: A dynamic approach to microprocessor verification","volume":"2","author":"Austin T. M.","year":"2000","unstructured":"T. M. Austin , \" Diva: A dynamic approach to microprocessor verification ,\" Journal of Instruction-Level Parallelism , vol. 2 , p. 2000 , 2000 . T. M. Austin, \"Diva: A dynamic approach to microprocessor verification,\" Journal of Instruction-Level Parallelism, vol. 2, p. 2000, 2000.","journal-title":"Journal of Instruction-Level Parallelism"},{"key":"e_1_3_2_1_18_1","first-page":"21","article-title":"Integrity s2: a fault-tolerant unix platform","author":"Jewett D.","year":"1991","unstructured":"D. Jewett , \" Integrity s2: a fault-tolerant unix platform ,\" Fault-Tolerant Computing , 1991 . FTCS- 21 . D. Jewett, \"Integrity s2: a fault-tolerant unix platform,\" Fault-Tolerant Computing, 1991. FTCS-21.","journal-title":"Fault-Tolerant Computing"},{"key":"e_1_3_2_1_19_1","first-page":"512","volume-title":"Twenty-First International Symposium","year":"1991","unstructured":"Digest of Papers. , Twenty-First International Symposium , pp. 512 -- 519 , Jun 1991 . Digest of Papers., Twenty-First International Symposium, pp. 512--519, Jun 1991."},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1147\/rd.523.0275"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2006.42"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2007.100"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/L-CA.2008.12"},{"key":"e_1_3_2_1_24_1","volume-title":"Workshop on Duplicating, Deconstructing, and Debunking (WDDD), in conjunction with ISCA'08","author":"Sanchez D.","year":"2008","unstructured":"D. Sanchez , J. L. Arag\u00b4on , and J. M. Garcia , Evaluating dynamic core coupling in a scalable tiled-cmp architecture,\" in Proc. of the 7th Int . Workshop on Duplicating, Deconstructing, and Debunking (WDDD), in conjunction with ISCA'08 , Jun 2008 . D. Sanchez, J. L. Arag\u00b4on, and J. M. Garcia, Evaluating dynamic core coupling in a scalable tiled-cmp architecture,\" in Proc. of the 7th Int. Workshop on Duplicating, Deconstructing, and Debunking (WDDD), in conjunction with ISCA'08, Jun 2008."},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1145\/285930.285983"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2007.98"},{"key":"e_1_3_2_1_27_1","unstructured":"The M5 Simulator System University of Michigan http:\/\/www.m5sim.org\/wiki\/index.php\/mainpage  The M5 Simulator System University of Michigan http:\/\/www.m5sim.org\/wiki\/index.php\/mainpage"}],"event":{"name":"ESWeek '09: Fifth Embedded Systems Week","sponsor":["ACM Association for Computing Machinery","SIGBED ACM Special Interest Group on Embedded Systems","SIGDA ACM Special Interest Group on Design Automation","SIGMICRO ACM Special Interest Group on Microarchitectural Research and Processing"],"location":"Grenoble France","acronym":"ESWeek '09"},"container-title":["Proceedings of the 2009 international conference on Compilers, architecture, and synthesis for embedded systems"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1629395.1629432","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1629395.1629432","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T12:41:27Z","timestamp":1750250487000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1629395.1629432"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,10,11]]},"references-count":27,"alternative-id":["10.1145\/1629395.1629432","10.1145\/1629395"],"URL":"https:\/\/doi.org\/10.1145\/1629395.1629432","relation":{},"subject":[],"published":{"date-parts":[[2009,10,11]]},"assertion":[{"value":"2009-10-11","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}