{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:53:21Z","timestamp":1750308801760,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":22,"publisher":"ACM","license":[{"start":{"date-parts":[[2009,11,2]],"date-time":"2009-11-02T00:00:00Z","timestamp":1257120000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2009,11,2]]},"DOI":"10.1145\/1687399.1687418","type":"proceedings-article","created":{"date-parts":[[2010,1,5]],"date-time":"2010-01-05T15:05:14Z","timestamp":1262703914000},"page":"83-88","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":8,"title":["Compacting test vector sets via strategic use of implications"],"prefix":"10.1145","author":[{"given":"Nuno","family":"Alves","sequence":"first","affiliation":[{"name":"Brown University, Providence, RI"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jennifer","family":"Dworak","sequence":"additional","affiliation":[{"name":"Brown University, Providence, RI"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Iris","family":"Bahar","sequence":"additional","affiliation":[{"name":"Brown University, Providence, RI"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Nepal","sequence":"additional","affiliation":[{"name":"Bucknell University, Lewisburg, PA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2009,11,2]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"1100","volume-title":"ITC","author":"Akers S.","year":"1987","unstructured":"S. Akers , C. Joseph , and B. Krishnamurthy . On the role of independent fault sets in the generation of minimal test sets . In ITC , pages 1100 -- 1107 , 1987 . S. Akers, C. Joseph, and B. Krishnamurthy. On the role of independent fault sets in the generation of minimal test sets. In ITC, pages 1100--1107, 1987."},{"key":"e_1_3_2_1_2_1","volume-title":"DATE","author":"Alves N.","year":"2009","unstructured":"N. Alves , K. Nepal , J. Dworak , and R. I. Bahar . Detecting errors using multi-cycle invariance information . In DATE , April 2009 . N. Alves, K. Nepal, J. Dworak, and R. I. Bahar. Detecting errors using multi-cycle invariance information. In DATE, April 2009."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_3_1","DOI":"10.1109\/MDT.2002.1033794"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_4_1","DOI":"10.5555\/839295.843630"},{"key":"e_1_3_2_1_5_1","volume-title":"ITC","author":"Geuzebroek M.","year":"2000","unstructured":"M. Geuzebroek , J. van der Linden, and A. van de Goor. Test point insertion for compact test sets . In ITC , 2000 . M. Geuzebroek, J. van der Linden, and A. van de Goor. Test point insertion for compact test sets. In ITC, 2000."},{"key":"e_1_3_2_1_6_1","volume-title":"ITC","author":"Geuzebroek M. J.","year":"2002","unstructured":"M. J. Geuzebroek , J. T. van der Linden, and A. J. van de Goor. Test point insertion that facilitates atpg in reducing test time and data volume . ITC , 2002 . M. J. Geuzebroek, J. T. van der Linden, and A. J. van de Goor. Test point insertion that facilitates atpg in reducing test time and data volume. ITC, 2002."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_7_1","DOI":"10.1109\/ATS.2005.36"},{"key":"e_1_3_2_1_8_1","first-page":"268","volume-title":"VTS","author":"Grimaila M. R.","year":"1999","unstructured":"M. R. Grimaila , S. Lee , J. Dworak , K. M. Butler , B. Stewart , H. Balachandran , B. Houchins , V. Mathur , J. Park , L.-C. Wang , and M. R. Mercer . REDO---random excitation and deterministic observation . In VTS , pages 268 -- 274 , 1999 . M. R. Grimaila, S. Lee, J. Dworak, K. M. Butler, B. Stewart, H. Balachandran, B. Houchins, V. Mathur, J. Park, L.-C. Wang, and M. R. Mercer. REDO---random excitation and deterministic observation. In VTS, pages 268--274, 1999."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_9_1","DOI":"10.5555\/795672.796970"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_10_1","DOI":"10.1109\/54.785838"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_11_1","DOI":"10.1109\/ISQED.2006.94"},{"key":"e_1_3_2_1_12_1","volume-title":"ICCD, page 418","author":"Jas A.","year":"1999","unstructured":"A. Jas and N. Touba . Using an embedded processor for efficient deterministic testing of systems-on-a-chip . In ICCD, page 418 , 1999 . A. Jas and N. Touba. Using an embedded processor for efficient deterministic testing of systems-on-a-chip. In ICCD, page 418, 1999."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_13_1","DOI":"10.1109\/VLSID.2006.125"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_14_1","DOI":"10.5555\/872025.872639"},{"key":"e_1_3_2_1_15_1","volume-title":"DATE, 94--101","author":"Lee S.","year":"2002","unstructured":"S. Lee , B. Cobb , J. Dworak , M. R. Grimaila , and M. R. Mercer . A new atpg algorithm to limit test set size and achieve multiple detections of all faults . In DATE, 94--101 , 2002 . S. Lee, B. Cobb, J. Dworak, M. R. Grimaila, and M. R. Mercer. A new atpg algorithm to limit test set size and achieve multiple detections of all faults. In DATE, 94--101, 2002."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_16_1","DOI":"10.5555\/648017.744461"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_17_1","DOI":"10.1007\/11527695_27"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_18_1","DOI":"10.1109\/TEST.1990.114081"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_19_1","DOI":"10.1109\/TEST.2008.4700614"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_20_1","DOI":"10.1109\/MDT.2003.1232257"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_21_1","DOI":"10.1109\/DFT.2008.39"},{"key":"e_1_3_2_1_22_1","first-page":"404","volume-title":"19th VLSI Test Symposium","author":"Tseng C.-W.","year":"2001","unstructured":"C.-W. Tseng , S. Mitra , S. Davidson , and E. J. McCluskey . An evaluation of pseudo random testing for detecting real defects . In 19th VLSI Test Symposium , pages 404 -- 409 , 2001 . C.-W. Tseng, S. Mitra, S. Davidson, and E. J. McCluskey. An evaluation of pseudo random testing for detecting real defects. In 19th VLSI Test Symposium, pages 404--409, 2001."}],"event":{"sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CAS","IEEE Council on Electronic Design Automation (CEDA)"],"acronym":"ICCAD '09","name":"ICCAD '09: The International Conference on Computer-Aided Design","location":"San Jose California"},"container-title":["Proceedings of the 2009 International Conference on Computer-Aided Design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1687399.1687418","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1687399.1687418","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T20:26:00Z","timestamp":1750278360000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1687399.1687418"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,11,2]]},"references-count":22,"alternative-id":["10.1145\/1687399.1687418","10.1145\/1687399"],"URL":"https:\/\/doi.org\/10.1145\/1687399.1687418","relation":{},"subject":[],"published":{"date-parts":[[2009,11,2]]},"assertion":[{"value":"2009-11-02","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}