{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,17]],"date-time":"2025-09-17T14:50:41Z","timestamp":1758120641715,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":11,"publisher":"ACM","license":[{"start":{"date-parts":[[2009,11,2]],"date-time":"2009-11-02T00:00:00Z","timestamp":1257120000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2009,11,2]]},"DOI":"10.1145\/1687399.1687494","type":"proceedings-article","created":{"date-parts":[[2010,1,5]],"date-time":"2010-01-05T15:05:14Z","timestamp":1262703914000},"page":"497-504","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":14,"title":["An elegant hardware-corroborated statistical repair and test methodology for conquering aging effects"],"prefix":"10.1145","author":[{"given":"Rouwaida","family":"Kanj","sequence":"first","affiliation":[{"name":"IBM Austin Research Labs, Austin, TX"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rajiv","family":"Joshi","sequence":"additional","affiliation":[{"name":"IBM TJ Watson Labs, Yorktown Heights, NY"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chad","family":"Adams","sequence":"additional","affiliation":[{"name":"IBM Systems and Technology Group, Rochester, MN"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"James","family":"Warnock","sequence":"additional","affiliation":[{"name":"IBM TJ Watson Labs, Yorktown Heights, NY"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sani","family":"Nassif","sequence":"additional","affiliation":[{"name":"IBM Austin Research Labs, Austin, TX"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2009,11,2]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"451","volume-title":"ISQED","author":"Nassif S. R.","year":"2000","unstructured":"S. R. Nassif , \"Design for variability in DSM technologies \", ISQED , 2000 , pp. 451 -- 454 S. R. Nassif, \"Design for variability in DSM technologies\", ISQED, 2000, pp. 451--454"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/313817.313908"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/SOI.2006.284405"},{"key":"e_1_3_2_1_4_1","first-page":"211","volume-title":"Proc. of the 30th ESSCC","author":"Joshi R. V.","year":"2004","unstructured":"R. V. Joshi 0 nm PD\/SOI CMOS SRAM cell\" , Proc. of the 30th ESSCC , 2004 , pp. 211 -- 214 . R. V. Joshi et al., \"Variability analysis for Sub-100 nm PD\/SOI CMOS SRAM cell\", Proc. of the 30th ESSCC, 2004, pp. 211--214."},{"key":"e_1_3_2_1_5_1","volume-title":"April","author":"Chang J.","year":"2007","unstructured":"J. Chang , \" The 65-nm 16-MB Shared On-Die L3 Cache for the Dual-Core Intel Xeon Processor 7100 Series\" JSSCC , April 2007 . J. Chang et al., \"The 65-nm 16-MB Shared On-Die L3 Cache for the Dual-Core Intel Xeon Processor 7100 Series\" JSSCC, April 2007."},{"volume-title":"IEEE 42nd IRPS 2004.","author":"Mueller K.","key":"e_1_3_2_1_6_1","unstructured":"K. Mueller Cell circuit dependence GOX SBD Model for accurate prediction of observed Vccmin test voltage dependency \", IEEE 42nd IRPS 2004. K. Mueller et al., \"6T Cell circuit dependence GOX SBD Model for accurate prediction of observed Vccmin test voltage dependency\", IEEE 42nd IRPS 2004."},{"volume-title":"44th IEEE IRPS 2006.","author":"La Rosa G.","key":"e_1_3_2_1_7_1","unstructured":"G. La Rosa NBTI Induced Statistical Variation to SRAM Cell Stability\" , 44th IEEE IRPS 2006. G. La Rosa et al., \"Impact of NBTI Induced Statistical Variation to SRAM Cell Stability\", 44th IEEE IRPS 2006."},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910437"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDER.2006.307701"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146930"},{"issue":"3","key":"e_1_3_2_1_11_1","doi-asserted-by":"crossref","first-page":"293","DOI":"10.1115\/1.4010337","article-title":"A statistical distribution function of wide applicability","volume":"18","author":"Weibull W.","year":"1951","unstructured":"W. Weibull , \" A statistical distribution function of wide applicability \" J. Appl. Mech.-Trans. ASME 18 ( 3 ), 293 -- 297 , 1951 . W. Weibull, \"A statistical distribution function of wide applicability\" J. Appl. Mech.-Trans. ASME 18(3), 293--297, 1951.","journal-title":"J. Appl. Mech.-Trans. ASME"}],"event":{"name":"ICCAD '09: The International Conference on Computer-Aided Design","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CAS","IEEE Council on Electronic Design Automation (CEDA)"],"location":"San Jose California","acronym":"ICCAD '09"},"container-title":["Proceedings of the 2009 International Conference on Computer-Aided Design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1687399.1687494","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1687399.1687494","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T20:26:22Z","timestamp":1750278382000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1687399.1687494"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,11,2]]},"references-count":11,"alternative-id":["10.1145\/1687399.1687494","10.1145\/1687399"],"URL":"https:\/\/doi.org\/10.1145\/1687399.1687494","relation":{},"subject":[],"published":{"date-parts":[[2009,11,2]]},"assertion":[{"value":"2009-11-02","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}