{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:32:47Z","timestamp":1750307567492,"version":"3.41.0"},"reference-count":4,"publisher":"Association for Computing Machinery (ACM)","issue":"1","license":[{"start":{"date-parts":[[2010,3,12]],"date-time":"2010-03-12T00:00:00Z","timestamp":1268352000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["SIGOPS Oper. Syst. Rev."],"published-print":{"date-parts":[[2010,3,12]]},"abstract":"<jats:p>Deployment of SSDs in enterprise settings is limited by the low erase cycles available on commodity devices. Redundancy solutions such as RAID can potentially be used to protect against the high Bit Error Rate (BER) of aging SSDs. Unfortunately, such solutions wear out redundant devices at similar rates, inducing correlated failures as arrays age in unison. We present Diff-RAID, a new RAID variant that distributes parity unevenly across SSDs to create age disparities within arrays. By doing so, Diff-RAID balances the high BER of old SSDs against the low BER of young SSDs. Diff-RAID provides much greater reliability for SSDs compared to RAID-4 and RAID-5 for the same space overhead, and offers a trade-off curve between throughput and reliability.<\/jats:p>","DOI":"10.1145\/1740390.1740403","type":"journal-article","created":{"date-parts":[[2010,3,19]],"date-time":"2010-03-19T19:22:47Z","timestamp":1269026567000},"page":"55-59","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":14,"title":["Differential RAID"],"prefix":"10.1145","volume":"44","author":[{"given":"Asim","family":"Kadav","sequence":"first","affiliation":[{"name":"University of Wisconsin, Madison, WI"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mahesh","family":"Balakrishnan","sequence":"additional","affiliation":[{"name":"Microsoft Research Silicon Valley, Mountain View, CA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vijayan","family":"Prabhakaran","sequence":"additional","affiliation":[{"name":"Microsoft Research Silicon Valley, Mountain View, CA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dahlia","family":"Malkhi","sequence":"additional","affiliation":[{"name":"Microsoft Research Silicon Valley, Mountain View, CA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2010,3,12]]},"reference":[{"key":"e_1_2_1_1_1","unstructured":"Intel Corporation. Intel X18-M\/X25-M SATA Solid State Drive. http:\/\/download.intel.com\/design\/flash\/nand\/mainstream\/mainstream-sata-ssd-datasheet.pdf.  Intel Corporation. Intel X18-M\/X25-M SATA Solid State Drive. http:\/\/download.intel.com\/design\/flash\/nand\/mainstream\/mainstream-sata-ssd-datasheet.pdf."},{"key":"e_1_2_1_2_1","volume-title":"Bit Error Rate in NAND Flash Memories. In IRPS 2008: IEEE International Reliability Physics Symposium","author":"Mielke N.","year":"2008","unstructured":"N. Mielke , T. Marquart , N. Wu , J. Kessenich , H. Belgal , E. Schares , F. Trivedi , E. Goodness , and L. Nevill . Bit Error Rate in NAND Flash Memories. In IRPS 2008: IEEE International Reliability Physics Symposium , 2008 . N. Mielke, T. Marquart, N. Wu, J. Kessenich, H. Belgal, E. Schares, F. Trivedi, E. Goodness, and L. Nevill. Bit Error Rate in NAND Flash Memories. In IRPS 2008: IEEE International Reliability Physics Symposium, 2008."},{"key":"e_1_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/1519065.1519081"},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/1498765.1498791"}],"container-title":["ACM SIGOPS Operating Systems Review"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1740390.1740403","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1740390.1740403","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T12:40:55Z","timestamp":1750250455000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1740390.1740403"}},"subtitle":["rethinking RAID for SSD reliability"],"short-title":[],"issued":{"date-parts":[[2010,3,12]]},"references-count":4,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2010,3,12]]}},"alternative-id":["10.1145\/1740390.1740403"],"URL":"https:\/\/doi.org\/10.1145\/1740390.1740403","relation":{},"ISSN":["0163-5980"],"issn-type":[{"type":"print","value":"0163-5980"}],"subject":[],"published":{"date-parts":[[2010,3,12]]},"assertion":[{"value":"2010-03-12","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}