{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T15:38:56Z","timestamp":1780673936354,"version":"3.54.1"},"publisher-location":"New York, NY, USA","reference-count":16,"publisher":"ACM","license":[{"start":{"date-parts":[[2010,2,26]],"date-time":"2010-02-26T00:00:00Z","timestamp":1267142400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2010,2,26]]},"DOI":"10.1145\/1741906.1742044","type":"proceedings-article","created":{"date-parts":[[2010,3,30]],"date-time":"2010-03-30T08:32:28Z","timestamp":1269937948000},"page":"601-605","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":14,"title":["Machine vision based liquid level inspection system using ISEF edge detection technique"],"prefix":"10.1145","author":[{"given":"K. J.","family":"Pithadiya","sequence":"first","affiliation":[{"name":"B &amp; B Institute of Technology, V V Nagar"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"C. K.","family":"Modi","sequence":"additional","affiliation":[{"name":"G H Patel College of Engg. &amp; Tech., V V Nagar"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"J. D.","family":"Chauhan","sequence":"additional","affiliation":[{"name":"B &amp; B Institute of Technology, V V Nagar"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2010,2,26]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"Alberto Martin \"Image Processing Techniques for machine vision\" Miami Florida (2000)."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1986.4767851"},{"key":"e_1_3_2_1_3_1","volume-title":"Proceeding Of The First International Conference On Machine Learning And Cybernetics","author":"Defect Detection System Without A Glass Bottle","year":"2002","unstructured":"Hui-MinMa\" A Glass Bottle Defect Detection System Without Touching\" Proceeding Of The First International Conference On Machine Learning And Cybernetics, Beijing, November (2002)."},{"key":"e_1_3_2_1_4_1","first-page":"89","volume-title":"GCET, V V Nagar, India","author":"Ishan Doshi","year":"2009","unstructured":"Ishan Doshi et al \"A simple and novel algorithm to detect over and under filled level of water bottle using Machnie Vision system, \"Proceedings of National Conference on Innovations in Mechatronics Engineering (IME09), GCET, V V Nagar, India, pp 89--92 (2009)."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICETET.2009.57"},{"key":"e_1_3_2_1_6_1","volume-title":"International Conference on Signals, Systems and Communication (ICSSC-2009)","author":"Jayesh","unstructured":"Jayesh Chuhan et al. \"Location M estimator for liquid level inspection using Machine Vision\", International Conference on Signals, Systems and Communication (ICSSC-2009), Anna University, Chennai, (accepted for presentation)."},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0166-3615(02)00141-0"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICETET.2009.55"},{"key":"e_1_3_2_1_9_1","unstructured":"(accepted to be published in IEEE Computer Society Proceedings)"},{"key":"e_1_3_2_1_10_1","first-page":"89","volume-title":"Proceedings of National Conference on Innovations in Mechatronics Engineering, GCET, V V Nagar","author":"Kunal","year":"2009","unstructured":"Kunal Pithadiya et al \"Performance evaluation of ISEF and Canny edge detector in Acrylic fiber quality control production\", Proceedings of National Conference on Innovations in Mechatronics Engineering, GCET, V V Nagar, India, pp 89--92. (2009)"},{"key":"e_1_3_2_1_11_1","volume-title":"International Conference on Signals, Systems and Communication (ICSSC-2009)","author":"Kunal","unstructured":"Kunal Pithadiya et al, \"Quality Inspection of Surface Mount Capacitor Using Optimal Edge detector\", International Conference on Signals, Systems and Communication (ICSSC-2009), Anna University, Chennai, (accepted for presentation)."},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.5555\/863630.879415"},{"key":"e_1_3_2_1_13_1","unstructured":"OMRON Tech. focused for automation solutions."},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.5555\/1283100.1283176"},{"key":"e_1_3_2_1_15_1","volume-title":"8th International Conference On Control Automation Robotics And Vision, China.","author":"Real Time Machine Vision Y. Wang","year":"2004","unstructured":"Y. Wang \"A Real Time Machine Vision System For Bottle Finish Inspection\"2004 8th International Conference On Control Automation Robotics And Vision, China. (2004)."},{"key":"e_1_3_2_1_16_1","article-title":"Glass Bottle Inspector Based On Machine Vision","author":"Wang Y.","year":"2008","unstructured":"Y. Wang, \"Glass Bottle Inspector Based On Machine Vision\" International Journal Of Intelligent Systems And Technologies. (2008)","journal-title":"International Journal Of Intelligent Systems And Technologies. ("}],"event":{"name":"ICWET '10: International Conference and Workshop on Emerging Trends in Technology","location":"Mumbai Maharashtra India","acronym":"ICWET '10","sponsor":["AICTE All India Council for Technical Education","UNITECH Unitech Engineers, India","SIGAI ACM Special Interest Group on Artificial Intelligence","SIGARCH ACM Special Interest Group on Computer Architecture"]},"container-title":["Proceedings of the International Conference and Workshop on Emerging Trends in Technology"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1741906.1742044","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1741906.1742044","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,17]],"date-time":"2026-05-17T22:50:33Z","timestamp":1779058233000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1741906.1742044"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,2,26]]},"references-count":16,"alternative-id":["10.1145\/1741906.1742044","10.1145\/1741906"],"URL":"https:\/\/doi.org\/10.1145\/1741906.1742044","relation":{},"subject":[],"published":{"date-parts":[[2010,2,26]]},"assertion":[{"value":"2010-02-26","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}