{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:32:51Z","timestamp":1750307571575,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":6,"publisher":"ACM","license":[{"start":{"date-parts":[[2010,2,26]],"date-time":"2010-02-26T00:00:00Z","timestamp":1267142400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2010,2,26]]},"DOI":"10.1145\/1741906.1742067","type":"proceedings-article","created":{"date-parts":[[2010,3,30]],"date-time":"2010-03-30T12:32:28Z","timestamp":1269952348000},"page":"698-699","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":5,"title":["Software reliability assessment using artificial neural network"],"prefix":"10.1145","author":[{"given":"I.","family":"Mandal","sequence":"first","affiliation":[{"name":"SRSIT, Bangalore, India"}]}],"member":"320","published-online":{"date-parts":[[2010,2,26]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"648","volume-title":"Digest of Papers. The Twenty-Third International Symposium on 22--24","author":"A","year":"1993","unstructured":"A systematic and comprehensive tool for software reliability modeling and measurement; Lyu, M. R.; Nikora, A. P.; Farr, W. H.; Fault-Tolerant Computing, 1993. FTCS-23 . Digest of Papers. The Twenty-Third International Symposium on 22--24 June 1993 Page(s): 648 -- 653 Digital Object Identifier 10.1109\/FTCS. 1993.627369 A systematic and comprehensive tool for software reliability modeling and measurement; Lyu, M. R.; Nikora, A. P.; Farr, W. H.; Fault-Tolerant Computing, 1993. FTCS-23. Digest of Papers. The Twenty-Third International Symposium on 22--24 June 1993 Page(s):648--653 Digital Object Identifier 10.1109\/FTCS.1993.627369"},{"key":"e_1_3_2_1_2_1","volume-title":"Computer Software and Applications Conference, 2004. COMPSAC 2004. Proceedings of the 28th Annual International 2004 Page(s):534--539","volume":"1","author":"An","year":"2004","unstructured":"An approach for software reliability model selection; Asad, C. A.; Ullah, M. I.; Rehman, M. J.-U . Computer Software and Applications Conference, 2004. COMPSAC 2004. Proceedings of the 28th Annual International 2004 Page(s):534--539 vol. 1 Digital Object Identifier 10.1109\/CMPSAC. 2004 .1342891 An approach for software reliability model selection; Asad, C. A.; Ullah, M. I.; Rehman, M. J.-U. Computer Software and Applications Conference, 2004. COMPSAC 2004. Proceedings of the 28th Annual International 2004 Page(s):534--539 vol. 1 Digital Object Identifier 10.1109\/CMPSAC.2004.1342891"},{"issue":"1","key":"e_1_3_2_1_3_1","first-page":"69","volume":"46","author":"Censored","year":"1997","unstructured":"Censored software-reliability models; Kai-Yuan Cai; Reliability , IEEE Transactions on Volume 46 , Issue 1 , March 1997 Page(s): 69 -- 75 Digital Object Identifier 10.1109\/24.589930 Censored software-reliability models; Kai-Yuan Cai; Reliability, IEEE Transactions on Volume 46, Issue 1, March 1997 Page(s):69--75 Digital Object Identifier 10.1109\/24.589930","journal-title":"IEEE Transactions on"},{"key":"e_1_3_2_1_4_1","first-page":"176","volume-title":"ISSRE 2001. Proceedings. 12th International Symposium on 27--30","author":"Discrete","year":"2001","unstructured":"Discrete equations and software reliability growth models; Satoh, D.; Yamada, S.; Software Reliability Engineering, 2001 . ISSRE 2001. Proceedings. 12th International Symposium on 27--30 Nov. 2001 Page(s): 176 -- 184 Discrete equations and software reliability growth models; Satoh, D.; Yamada, S.; Software Reliability Engineering, 2001. ISSRE 2001. Proceedings. 12th International Symposium on 27--30 Nov. 2001 Page(s):176--184"},{"issue":"1","key":"e_1_3_2_1_5_1","first-page":"37","volume":"49","author":"Failure","year":"2000","unstructured":"Failure correlation in software reliability models; Goseva-Popstojanova, K.; Trivedi , K. S. ; Reliability , IEEE Transactions on Volume 49 , Issue 1 , March 2000 Page(s): 37 -- 48 Digital Object Identifier 10.1109\/24.855535 Failure correlation in software reliability models; Goseva-Popstojanova, K.; Trivedi, K. S.; Reliability, IEEE Transactions on Volume 49, Issue 1, March 2000 Page(s):37--48 Digital Object Identifier 10.1109\/24.855535","journal-title":"IEEE Transactions on"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2006.889475"}],"event":{"name":"ICWET '10: International Conference and Workshop on Emerging Trends in Technology","sponsor":["UNITECH Unitech Engineers, India","AICTE All India Council for Technical Education","SIGAI ACM Special Interest Group on Artificial Intelligence","SIGARCH ACM Special Interest Group on Computer Architecture"],"location":"Mumbai Maharashtra India","acronym":"ICWET '10"},"container-title":["Proceedings of the International Conference and Workshop on Emerging Trends in Technology"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1741906.1742067","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1741906.1742067","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T12:41:01Z","timestamp":1750250461000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1741906.1742067"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,2,26]]},"references-count":6,"alternative-id":["10.1145\/1741906.1742067","10.1145\/1741906"],"URL":"https:\/\/doi.org\/10.1145\/1741906.1742067","relation":{},"subject":[],"published":{"date-parts":[[2010,2,26]]},"assertion":[{"value":"2010-02-26","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}