{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:30:09Z","timestamp":1750307409451,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":7,"publisher":"ACM","license":[{"start":{"date-parts":[[2010,5,16]],"date-time":"2010-05-16T00:00:00Z","timestamp":1273968000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2010,5,16]]},"DOI":"10.1145\/1785481.1785515","type":"proceedings-article","created":{"date-parts":[[2010,5,18]],"date-time":"2010-05-18T13:46:25Z","timestamp":1274190385000},"page":"139-142","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["A delay measurement method using a shrinking clock signal"],"prefix":"10.1145","author":[{"given":"Jae Wook","family":"Lee","sequence":"first","affiliation":[{"name":"The University of Texas at Austin, Austin, TX, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ji Hwan","family":"Chun","sequence":"additional","affiliation":[{"name":"The University of Texas at Austin, Austin, TX, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jacob A.","family":"Abraham","sequence":"additional","affiliation":[{"name":"The University of Texas at Austin, Austin, TX, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2010,5,16]]},"reference":[{"volume-title":"Semiconductor Equipment and Materials International","year":"1999","key":"e_1_3_2_1_1_1","unstructured":"Semi draft doc. #2928 : Specification for overall digital timing accuracy. Technical report , Semiconductor Equipment and Materials International , 1999 . Semi draft doc. #2928: Specification for overall digital timing accuracy. Technical report, Semiconductor Equipment and Materials International, 1999."},{"key":"e_1_3_2_1_2_1","first-page":"281","volume-title":"Proceedings, IEEE International Symposium on Circuits and Systems (ISCAS '97)","volume":"1","author":"Chen P.","year":"1997","unstructured":"P. Chen , S.-I. Liu , and J. Wu . A low power high accuracy CMOS time-to-digital converter . In Proceedings, IEEE International Symposium on Circuits and Systems (ISCAS '97) , vol. 1 , pages 281 -- 284 , June 1997 . P. Chen, S.-I. Liu, and J. Wu. A low power high accuracy CMOS time-to-digital converter. In Proceedings, IEEE International Symposium on Circuits and Systems (ISCAS '97), vol. 1, pages 281--284, June 1997."},{"key":"e_1_3_2_1_3_1","first-page":"518","volume-title":"Proceedings, International Test Conference","author":"Dalal W.","year":"1999","unstructured":"W. Dalal and S. Miao . The value of tester accuracy . In Proceedings, International Test Conference , pages 518 -- 523 , 1999 . W. Dalal and S. Miao. The value of tester accuracy. In Proceedings, International Test Conference, pages 518--523, 1999."},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2006.11"},{"key":"e_1_3_2_1_5_1","volume-title":"Automation & Test in Europe Conference & Exhibition (DATE '07)","author":"Keezer D.","year":"2007","unstructured":"D. Keezer , D. Minier , and P. Ducharme . Method for reducing jitter in multi-gigahertz ATE. In Design , Automation & Test in Europe Conference & Exhibition (DATE '07) , April 2007 . D. Keezer, D. Minier, and P. Ducharme. Method for reducing jitter in multi-gigahertz ATE. In Design, Automation & Test in Europe Conference & Exhibition (DATE '07), April 2007."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.23"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1990.112125"}],"event":{"name":"GLSVLSI '10: Great Lakes Symposium on VLSI 2010","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CEDA","IEEE CASS"],"location":"Providence Rhode Island USA","acronym":"GLSVLSI '10"},"container-title":["Proceedings of the 20th symposium on Great lakes symposium on VLSI"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1785481.1785515","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1785481.1785515","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T11:39:31Z","timestamp":1750246771000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1785481.1785515"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,5,16]]},"references-count":7,"alternative-id":["10.1145\/1785481.1785515","10.1145\/1785481"],"URL":"https:\/\/doi.org\/10.1145\/1785481.1785515","relation":{},"subject":[],"published":{"date-parts":[[2010,5,16]]},"assertion":[{"value":"2010-05-16","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}