{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,7]],"date-time":"2023-09-07T19:42:41Z","timestamp":1694115761874},"publisher-location":"New York, NY, USA","reference-count":0,"publisher":"ACM","isbn-type":[{"value":"9781450300384","type":"print"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,6,14]]},"DOI":"10.1145\/1811039","type":"proceedings","created":{"date-parts":[[2010,6,15]],"date-time":"2010-06-15T13:11:04Z","timestamp":1276607464000},"source":"Crossref","is-referenced-by-count":3,"title":["Proceedings of the ACM SIGMETRICS international conference on Measurement and modeling of computer systems"],"prefix":"10.1145","member":"320","published-online":{"date-parts":[[2010,6,14]]},"event":{"name":"SIGMETRICS '10: ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems","location":"New York New York USA","acronym":"SIGMETRICS '10","sponsor":["SIGMETRICS ACM Special Interest Group on Measurement and Evaluation"]},"container-title":[],"original-title":[],"deposited":{"date-parts":[[2023,9,4]],"date-time":"2023-09-04T11:26:23Z","timestamp":1693826783000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/proceedings\/10.1145\/1811039"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6,14]]},"ISBN":["9781450300384"],"references-count":0,"alternative-id":["10.1145\/1811039"],"URL":"https:\/\/doi.org\/10.1145\/1811039","relation":{},"subject":[],"published":{"date-parts":[[2010,6,14]]}}}