{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T17:57:33Z","timestamp":1772042253759,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":27,"publisher":"ACM","license":[{"start":{"date-parts":[[2010,6,13]],"date-time":"2010-06-13T00:00:00Z","timestamp":1276387200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2010,6,13]]},"DOI":"10.1145\/1837274.1837366","type":"proceedings-article","created":{"date-parts":[[2010,10,28]],"date-time":"2010-10-28T14:47:40Z","timestamp":1288277260000},"page":"362-367","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":46,"title":["Fully X-tolerant, very high scan compression"],"prefix":"10.1145","author":[{"given":"Peter","family":"Wohl","sequence":"first","affiliation":[{"name":"Synopsys, Inc."}]},{"given":"John A.","family":"Waicukauski","sequence":"additional","affiliation":[{"name":"Synopsys, Inc."}]},{"given":"Frederic","family":"Neuveux","sequence":"additional","affiliation":[{"name":"Synopsys, Inc."}]},{"given":"Emil","family":"Gizdarski","sequence":"additional","affiliation":[{"name":"Synopsys, Inc."}]}],"member":"320","published-online":{"date-parts":[[2010,6,13]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"Kluwer Academic Publishers","author":"Bushnell M. L.","year":"2000"},{"key":"e_1_3_2_1_2_1","first-page":"688","author":"Vermeulen B.","year":"2004","journal-title":"International Test Conference"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"crossref","unstructured":"F.-F. Ferhani and E. J. McCluskey \"Classifying bad chips and ordering test sets \" International Test Conference 2006. F.-F. Ferhani and E. J. McCluskey \"Classifying bad chips and ordering test sets \" International Test Conference 2006.","DOI":"10.1109\/TEST.2006.297736"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"crossref","unstructured":"B. Keller M. Tegethoff T. Bartenstein and V. Chickermane \"An economic analysis and ROI model for nanometer test \" International Test Conference 2004 pp. 518--524. B. Keller M. Tegethoff T. Bartenstein and V. Chickermane \"An economic analysis and ROI model for nanometer test \" International Test Conference 2004 pp. 518--524.","DOI":"10.1109\/TEST.2004.1386988"},{"key":"e_1_3_2_1_5_1","unstructured":"Semiconductor Industry Association. (2007) International Technology Roadmap for Semiconductors (ITRS) http:\/\/www.itrs.net\/Links\/2007ITRS\/Home2007.htm. Semiconductor Industry Association. (2007) International Technology Roadmap for Semiconductors (ITRS) http:\/\/www.itrs.net\/Links\/2007ITRS\/Home2007.htm."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1188267"},{"key":"e_1_3_2_1_7_1","volume-title":"International Test Conf.","author":"Dutta A.","year":"2006"},{"key":"e_1_3_2_1_8_1","volume-title":"European Test Conference","author":"K\u00f6nemann B.","year":"1991"},{"key":"e_1_3_2_1_9_1","first-page":"727","volume-title":"International Test Conference","author":"Wohl P.","year":"2003"},{"key":"e_1_3_2_1_10_1","first-page":"120","volume-title":"International Test Conf.","author":"Hellebrand S.","year":"2002"},{"key":"e_1_3_2_1_11_1","unstructured":"S. Chiusano S. DiCarlo P. Prinetto H.-J. Wunderlich \"On Applying the Set Covering Model to Reseeding \" Design and Test Europe 2001. S. Chiusano S. DiCarlo P. Prinetto H.-J. Wunderlich \"On Applying the Set Covering Model to Reseeding \" Design and Test Europe 2001."},{"key":"e_1_3_2_1_12_1","first-page":"200","volume-title":"Asian Test Symposium","author":"Lai N. C.","year":"2002"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775975"},{"key":"e_1_3_2_1_14_1","volume-title":"International Test Conference","author":"Wohl P.","year":"2005"},{"key":"e_1_3_2_1_15_1","volume-title":"International Test Conference","author":"Mitra S.","year":"2004"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.38"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.81"},{"key":"e_1_3_2_1_18_1","first-page":"107","volume-title":"VLSI Test Symposium","author":"Patel J. H.","year":"2003"},{"key":"e_1_3_2_1_20_1","volume-title":"International Test Conference","author":"Wohl P.","year":"2007"},{"key":"e_1_3_2_1_21_1","volume-title":"International Test Conference","author":"Rajski J.","year":"2003"},{"key":"e_1_3_2_1_22_1","volume-title":"International Test Conference","author":"Sharma M.","year":"2005"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.11"},{"key":"e_1_3_2_1_24_1","first-page":"748","volume-title":"International Test Conference","author":"Barnhart C.","year":"2001"},{"key":"e_1_3_2_1_25_1","volume-title":"International Test Conf.","author":"Chickermane V.","year":"2004"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065614"},{"key":"e_1_3_2_1_27_1","volume-title":"International Test Conference","author":"Touba N. A.","year":"2007"},{"key":"e_1_3_2_1_28_1","volume-title":"International Test Conference","author":"Wohl P.","year":"2001"}],"event":{"name":"DAC '10: The 47th Annual Design Automation Conference 2010","location":"Anaheim California","acronym":"DAC '10","sponsor":["EDAC Electronic Design Automation Consortium","SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA"]},"container-title":["Proceedings of the 47th Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1837274.1837366","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1837274.1837366","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T11:39:35Z","timestamp":1750246775000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1837274.1837366"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6,13]]},"references-count":27,"alternative-id":["10.1145\/1837274.1837366","10.1145\/1837274"],"URL":"https:\/\/doi.org\/10.1145\/1837274.1837366","relation":{},"subject":[],"published":{"date-parts":[[2010,6,13]]},"assertion":[{"value":"2010-06-13","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}