{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,3]],"date-time":"2026-10-03T17:46:35Z","timestamp":1791049595249,"version":"4.1.0"},"publisher-location":"New York, NY, USA","reference-count":32,"publisher":"ACM","license":[{"start":{"date-parts":[[2010,6,13]],"date-time":"2010-06-13T00:00:00Z","timestamp":1276387200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2010,6,13]]},"DOI":"10.1145\/1837274.1837406","type":"proceedings-article","created":{"date-parts":[[2010,10,28]],"date-time":"2010-10-28T14:47:40Z","timestamp":1288277260000},"page":"531-536","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":8,"title":["Formal modeling and reasoning for reliability analysis"],"prefix":"10.1145","author":[{"given":"Natasa","family":"Miskov-Zivanov","sequence":"first","affiliation":[{"name":"University of Pittsburgh"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Diana","family":"Marculescu","sequence":"additional","affiliation":[{"name":"Carnegie Mellon University"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2010,6,13]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/1233501.1233602"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2005.61"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.156"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2012530"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.274"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.5555\/1302494.1302871"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.5555\/1874620.1874814"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1147\/rd.523.0255"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.47"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391703"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.5555\/368058.368413"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"crossref","unstructured":"T. C. May \"Soft Errors in VLSI: Present and Future \" in IEEE Transactions on Components Hybrids and Manufacturing Technology CHMT-2 No. 4 pp. 377--387 1979.  T. C. May \"Soft Errors in VLSI: Present and Future \" in IEEE Transactions on Components Hybrids and Manufacturing Technology CHMT-2 No. 4 pp. 377--387 1979.","DOI":"10.1109\/TCHMT.1979.1135487"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882592"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2009.4810329"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.917591"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"crossref","unstructured":"N. Miskov-Zivanov K.-C. Wu and D. Marculescu \"Process Variability-Aware Transient Fault Modeling and Analysis \" in Proc. of International Conference on Computer-Aided Design (ICCAD) pp. 685--690 November 2008.   N. Miskov-Zivanov K.-C. Wu and D. Marculescu \"Process Variability-Aware Transient Fault Modeling and Analysis \" in Proc. of International Conference on Computer-Aided Design (ICCAD) pp. 685--690 November 2008.","DOI":"10.1109\/ICCAD.2008.4681651"},{"key":"e_1_3_2_1_18_1","unstructured":"S. Mitra M. Zhang T. Mak N. Seifert V. Zia and K. S. Kim \"Logic soft errors: a major barrier to robust platform design \" in Proc. of International Test Conference (ITC) November 2005.  S. Mitra M. Zhang T. Mak N. Seifert V. Zia and K. S. Kim \"Logic soft errors: a major barrier to robust platform design \" in Proc. of International Test Conference (ITC) November 2005."},{"key":"e_1_3_2_1_19_1","unstructured":"M. Omana G. Papasso D. Rossi and C. Metra \"A Model for Transient Fault Propagation in Combinatorial Logic \" in Proc. of IEEE International On-Line Testing Symposium (IOLT)S pp. 11--115 July 2003.  M. Omana G. Papasso D. Rossi and C. Metra \"A Model for Transient Fault Propagation in Combinatorial Logic \" in Proc. of IEEE International On-Line Testing Symposium (IOLT)S pp. 11--115 July 2003."},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687428"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2006.143"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"crossref","unstructured":"K. Ramakrishnan R. Rajaraman N. Vijaykrishnan Y. Xie M. J. Irwin and K. Unlu \"Hierarchical Soft Error Estimation Tool (HSEET) \" in Proc. of International Symposium on Quality Electronics Design (ISQED) pp. 680--683 March 2008.   K. Ramakrishnan R. Rajaraman N. Vijaykrishnan Y. Xie M. J. Irwin and K. Unlu \"Hierarchical Soft Error Estimation Tool (HSEET) \" in Proc. of International Symposium on Quality Electronics Design (ISQED) pp. 680--683 March 2008.","DOI":"10.1109\/ISQED.2008.4479819"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.168"},{"key":"e_1_3_2_1_24_1","first-page":"164","volume-title":"Automation and Test in Europe (DATE)","author":"Rao R. R.","year":"2006"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1145\/1233501.1233603"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.891036"},{"key":"e_1_3_2_1_27_1","first-page":"217","article-title":"Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices","author":"Seifert N.","year":"2006","journal-title":"Proc. of the IEEE International Reliability Physics Symposium"},{"key":"e_1_3_2_1_28_1","unstructured":"P. Shivakumar M. Kistler S. W. Keckler D. Burger and L. Alvisi \"Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic \" in Proc. of International Conference on Dependable Systems and Networks pp. 389--398 June 2002.   P. Shivakumar M. Kistler S. W. Keckler D. Burger and L. Alvisi \"Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic \" in Proc. of International Conference on Dependable Systems and Networks pp. 389--398 June 2002."},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2006.64"},{"key":"e_1_3_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382553"},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1145\/996566.996804"},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1147\/rd.401.0003"}],"event":{"name":"DAC '10: The 47th Annual Design Automation Conference 2010","location":"Anaheim California","acronym":"DAC '10","sponsor":["EDAC Electronic Design Automation Consortium","SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA"]},"container-title":["Proceedings of the 47th Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1837274.1837406","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1837274.1837406","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T11:39:35Z","timestamp":1750246775000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1837274.1837406"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6,13]]},"references-count":32,"alternative-id":["10.1145\/1837274.1837406","10.1145\/1837274"],"URL":"https:\/\/doi.org\/10.1145\/1837274.1837406","relation":{},"subject":[],"published":{"date-parts":[[2010,6,13]]},"assertion":[{"value":"2010-06-13","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}