{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,3]],"date-time":"2026-10-03T23:42:32Z","timestamp":1791070952856,"version":"4.1.0"},"publisher-location":"New York, NY, USA","reference-count":15,"publisher":"ACM","license":[{"start":{"date-parts":[[2010,6,13]],"date-time":"2010-06-13T00:00:00Z","timestamp":1276387200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2010,6,13]]},"DOI":"10.1145\/1837274.1837500","type":"proceedings-article","created":{"date-parts":[[2010,10,28]],"date-time":"2010-10-28T14:47:40Z","timestamp":1288277260000},"page":"897-902","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":12,"title":["Toward efficient large-scale performance modeling of integrated circuits via multi-mode\/multi-corner sparse regression"],"prefix":"10.1145","author":[{"given":"Wangyang","family":"Zhang","sequence":"first","affiliation":[{"name":"Mentor Graphics Corporation, San Jose, CA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tsung-Hao","family":"Chen","sequence":"additional","affiliation":[{"name":"Mentor Graphics Corporation, San Jose, CA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ming-Yuan","family":"Ting","sequence":"additional","affiliation":[{"name":"Mentor Graphics Corporation, San Jose, CA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xin","family":"Li","sequence":"additional","affiliation":[{"name":"Carnegie Mellon University, Pittsburgh, PA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2010,6,13]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"Semiconductor Industry Associate International Technology Roadmap for Semiconductors 2007.  Semiconductor Industry Associate International Technology Roadmap for Semiconductors 2007."},{"key":"e_1_3_2_1_2_1","first-page":"721","article-title":"Projection-based performance modeling for inter\/intra-die variations","author":"Li X.","year":"2005","journal-title":"IEEE ICCAD"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/1233501.1233684"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/1278480.1278542"},{"key":"e_1_3_2_1_5_1","first-page":"632","article-title":"Principle Hessian direction based parameter reduction for interconnect networks with process variation","author":"Mitev A.","year":"2007","journal-title":"IEEE ICCAD"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391482"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630009"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/378239.379079"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2021034"},{"key":"e_1_3_2_1_10_1","first-page":"185","article-title":"Low-noise amplifier comparison at 2GHz in 0.25-μm and 0.18-μm RF-CMOS and SiGe BiCMOS","author":"Floyd B.","year":"2004","journal-title":"IEEE RFIC"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2008.2005866"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"crossref","unstructured":"G. Seber Multivariate Observations Wiley Series 1984.  G. Seber Multivariate Observations Wiley Series 1984.","DOI":"10.1002\/9780470316641"},{"key":"e_1_3_2_1_13_1","volume-title":"Duxbury Press","author":"Casella G.","year":"2001"},{"key":"e_1_3_2_1_14_1","volume-title":"Springer","author":"Hastie T.","year":"2003"},{"key":"e_1_3_2_1_15_1","unstructured":"S. Sapatnekar Timing Springer 2004.   S. Sapatnekar Timing Springer 2004."}],"event":{"name":"DAC '10: The 47th Annual Design Automation Conference 2010","location":"Anaheim California","acronym":"DAC '10","sponsor":["EDAC Electronic Design Automation Consortium","SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA"]},"container-title":["Proceedings of the 47th Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1837274.1837500","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1837274.1837500","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T11:23:10Z","timestamp":1750245790000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1837274.1837500"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6,13]]},"references-count":15,"alternative-id":["10.1145\/1837274.1837500","10.1145\/1837274"],"URL":"https:\/\/doi.org\/10.1145\/1837274.1837500","relation":{},"subject":[],"published":{"date-parts":[[2010,6,13]]},"assertion":[{"value":"2010-06-13","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}