{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:29:23Z","timestamp":1750307363277,"version":"3.41.0"},"reference-count":0,"publisher":"Association for Computing Machinery (ACM)","issue":"8","license":[{"start":{"date-parts":[[2010,8,1]],"date-time":"2010-08-01T00:00:00Z","timestamp":1280620800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["Queue"],"published-print":{"date-parts":[[2010,8]]},"abstract":"<jats:p>It is an unfortunate fact of life that anything with moving parts eventually wears out and malfunctions, and electronic circuitry is no exception. In this case, of course, the moving parts are electrons. In addition to the wear-out mechanisms of electromigration (the moving electrons gradually push the metal atoms out of position, causing wires to thin, thus increasing their resistance and eventually producing open circuits) and dendritic growth (the voltage difference between adjacent wires causes the displaced metal atoms to migrate toward each other, just as magnets will attract each other, eventually causing shorts), electronic circuits are also vulnerable to background radiation. These fast-moving charged particles knock electrons out of their orbits, leaving ionized trails in their wake. Until those electrons find their way back home, a conductive path exists where there once was none.<\/jats:p>","DOI":"10.1145\/1839572.1839574","type":"journal-article","created":{"date-parts":[[2010,8,11]],"date-time":"2010-08-11T12:57:24Z","timestamp":1281531444000},"page":"10-18","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Injecting Errors for Fun and Profit"],"prefix":"10.1145","volume":"8","author":[{"given":"Steve","family":"Chessin","sequence":"first","affiliation":[{"name":"Oracle"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2010,8]]},"container-title":["Queue"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1839572.1839574","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1839572.1839574","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T11:22:36Z","timestamp":1750245756000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1839572.1839574"}},"subtitle":["Error-detection and correction features are only as good as our ability to test them."],"short-title":[],"issued":{"date-parts":[[2010,8]]},"references-count":0,"journal-issue":{"issue":"8","published-print":{"date-parts":[[2010,8]]}},"alternative-id":["10.1145\/1839572.1839574"],"URL":"https:\/\/doi.org\/10.1145\/1839572.1839574","relation":{},"ISSN":["1542-7730","1542-7749"],"issn-type":[{"type":"print","value":"1542-7730"},{"type":"electronic","value":"1542-7749"}],"subject":[],"published":{"date-parts":[[2010,8]]},"assertion":[{"value":"2010-08-01","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}