{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,1,7]],"date-time":"2023-01-07T05:27:50Z","timestamp":1673069270190},"publisher-location":"New York, NY, USA","reference-count":0,"publisher":"ACM","isbn-type":[{"value":"9781450300391","type":"print"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,9,16]]},"DOI":"10.1145\/1852786","type":"proceedings","created":{"date-parts":[[2010,9,14]],"date-time":"2010-09-14T14:53:20Z","timestamp":1284476000000},"source":"Crossref","is-referenced-by-count":0,"title":["Proceedings of the 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement"],"prefix":"10.1145","member":"320","published-online":{"date-parts":[[2010,9,16]]},"event":{"name":"ESEM '10: 2010 ACM-IEEE International Symposium on Empirical Software Engineering and Measurement","location":"Bolzano-Bozen Italy","acronym":"ESEM '10","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering","IEEE CS"]},"container-title":[],"original-title":[],"deposited":{"date-parts":[[2023,1,6]],"date-time":"2023-01-06T03:10:55Z","timestamp":1672974655000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/proceedings\/10.1145\/1852786"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9,16]]},"ISBN":["9781450300391"],"references-count":0,"alternative-id":["10.1145\/1852786"],"URL":"https:\/\/doi.org\/10.1145\/1852786","relation":{},"subject":[],"published":{"date-parts":[[2010,9,16]]}}}