{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:29:25Z","timestamp":1750307365524,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":10,"publisher":"ACM","license":[{"start":{"date-parts":[[2010,9,6]],"date-time":"2010-09-06T00:00:00Z","timestamp":1283731200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2010,9,6]]},"DOI":"10.1145\/1854153.1854182","type":"proceedings-article","created":{"date-parts":[[2010,9,7]],"date-time":"2010-09-07T15:48:28Z","timestamp":1283874508000},"page":"109-114","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["On evaluating the signal reliability of self-checking arithmetic circuits"],"prefix":"10.1145","author":[{"given":"Denis Teixeira","family":"Franco","sequence":"first","affiliation":[{"name":"Federal University of Rio Grande, Rio Grande, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ma\u00ed Correa","family":"Vasconcelos","sequence":"additional","affiliation":[{"name":"T\u00e9l\u00e9com ParisTech, Paris, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lirida Barros","family":"Naviner","sequence":"additional","affiliation":[{"name":"T\u00e9l\u00e9com ParisTech, Paris, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jean-Fran\u00e7ois","family":"Naviner","sequence":"additional","affiliation":[{"name":"T\u00e9l\u00e9com ParisTech, Paris, France"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2010,9,6]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF","author":"Vasconcelos M.C.","year":"2008","unstructured":"M.C. Vasconcelos , D.T. Franco , L.A. Naviner , and J.-F. Naviner . Relevant metrics for evaluation of concurrent error detection schemes. Microelectronics Reliability, 48(8--9):1601--1603, 2008 . 19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2008 ). M.C. Vasconcelos, D.T. Franco, L.A. Naviner, and J.-F. Naviner. Relevant metrics for evaluation of concurrent error detection schemes. Microelectronics Reliability, 48(8--9):1601--1603, 2008. 19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2008)."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2008.4606383"},{"key":"e_1_3_2_1_3_1","volume-title":"Nov.-Dec.","author":"Franco D.T.","year":"2006","unstructured":"D.T. Franco , J.-F. Naviner , and L.A. Naviner . Yield and reliability issues in nanoelectronic technologies. Annales des telecommunications, 61(11--12):1422--1457 , Nov.-Dec. 2006 . D.T. Franco, J.-F. Naviner, and L.A. Naviner. Yield and reliability issues in nanoelectronic technologies. Annales des telecommunications, 61(11--12):1422--1457, Nov.-Dec. 2006."},{"volume-title":"ITRS Website","year":"2009","key":"e_1_3_2_1_4_1","unstructured":"International Technology Roadmap for Semiconductors. 2009 edition, executive summary . ITRS Website , May 2010. http:\/\/www.itrs.net\/Links\/2009ITRS\/2009Chapters_2009Tables\/2009_ExecSum.pdf. International Technology Roadmap for Semiconductors. 2009 edition, executive summary. ITRS Website, May 2010. http:\/\/www.itrs.net\/Links\/2009ITRS\/2009Chapters_2009Tables\/2009_ExecSum.pdf."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.5555\/647834.738161"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882592"},{"issue":"3","key":"e_1_3_2_1_7_1","first-page":"405","article-title":"Design for soft error mitigation. Device and Materials Reliability","volume":"5","author":"Nicolaidis M.","year":"2005","unstructured":"M. Nicolaidis . Design for soft error mitigation. Device and Materials Reliability , IEEE Transactions on , 5 ( 3 ): 405 -- 418 , Sept. 2005 . M. Nicolaidis. Design for soft error mitigation. Device and Materials Reliability, IEEE Transactions on, 5(3):405--418, Sept. 2005.","journal-title":"IEEE Transactions on"},{"key":"e_1_3_2_1_8_1","unstructured":"N. Seifert P. Slankard M. Kirsch B. Narasimham V. Zia C. Brookreson A. Vo S. Mitra B. Gill and J. Maiz.  N. Seifert P. Slankard M. Kirsch B. Narasimham V. Zia C. Brookreson A. Vo S. Mitra B. Gill and J. Maiz."},{"volume-title":"Reliability Physics Symposium Proceedings, 2006","year":"2006","key":"e_1_3_2_1_9_1","unstructured":"Radiation-induced soft error rates of advanced cmos bulk devices . Reliability Physics Symposium Proceedings, 2006 . 44th Annual, IEEE International, pages 217- -225, March 2006 . Radiation-induced soft error rates of advanced cmos bulk devices. Reliability Physics Symposium Proceedings, 2006. 44th Annual, IEEE International, pages 217--225, March 2006."},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.5555\/1078036.1079751"}],"event":{"name":"SBCCI '10: 23rd Symposium on Integrated Circuits and Systems Design","sponsor":["SIGDA ACM Special Interest Group on Design Automation","SBMicro","IEEE ICAS","IEEE Circuits and Systems Society","SBC"],"location":"S\u00e3o Paulo Brazil","acronym":"SBCCI '10"},"container-title":["Proceedings of the 23rd symposium on Integrated circuits and system design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1854153.1854182","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1854153.1854182","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T11:22:41Z","timestamp":1750245761000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1854153.1854182"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9,6]]},"references-count":10,"alternative-id":["10.1145\/1854153.1854182","10.1145\/1854153"],"URL":"https:\/\/doi.org\/10.1145\/1854153.1854182","relation":{},"subject":[],"published":{"date-parts":[[2010,9,6]]},"assertion":[{"value":"2010-09-06","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}