{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,6]],"date-time":"2022-04-06T04:30:15Z","timestamp":1649219415407},"publisher-location":"New York, New York, USA","reference-count":0,"publisher":"ACM Press","isbn-type":[{"value":"0897916832","type":"print"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[1994]]},"DOI":"10.1145\/186258","type":"proceedings","created":{"date-parts":[[2004,2,3]],"date-time":"2004-02-03T17:41:00Z","timestamp":1075830060000},"source":"Crossref","is-referenced-by-count":0,"title":["Proceedings of the 1994 international symposium on Software testing and analysis  - ISSTA '94"],"prefix":"10.1145","member":"320","event":{"name":"the 1994 international symposium","location":"Seattle, Washington, United States","acronym":"ISSTA '94","number":"1994","sponsor":["SIGSOFT, ACM Special Interest Group on Software Engineering"],"start":{"date-parts":[[1994,8,17]]},"end":{"date-parts":[[1994,8,19]]}},"container-title":[],"original-title":[],"deposited":{"date-parts":[[2013,12,16]],"date-time":"2013-12-16T23:08:32Z","timestamp":1387235312000},"score":1,"resource":{"primary":{"URL":"http:\/\/portal.acm.org\/citation.cfm?doid=186258"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1994]]},"ISBN":["0897916832"],"references-count":0,"URL":"https:\/\/doi.org\/10.1145\/186258","relation":{},"subject":[],"published":{"date-parts":[[1994]]}}}