{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:28:16Z","timestamp":1750307296001,"version":"3.41.0"},"reference-count":26,"publisher":"Association for Computing Machinery (ACM)","issue":"1","license":[{"start":{"date-parts":[[2010,11,1]],"date-time":"2010-11-01T00:00:00Z","timestamp":1288569600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["ACM Trans. Des. Autom. Electron. Syst."],"published-print":{"date-parts":[[2010,11]]},"abstract":"<jats:p>This article presents several scan-cell reordering techniques to reduce the signal transitions during the test mode while preserving the don\u2019t-care bits in the test patterns for a later optimization. Combined with a pattern-filling technique, the proposed scan-cell reordering techniques can utilize both high response correlations and pattern correlations to simultaneously minimize scan-out and scan-in transitions. Those scan-shift transitions can be further reduced by selectively using the inverse connections between scan cells. In addition, the trade-off between routing overhead and power consumption can also be controlled by the proposed scan-cell reordering techniques. A series of experiments are conducted to demonstrate the effectiveness of each of the proposed techniques individually.<\/jats:p>","DOI":"10.1145\/1870109.1870119","type":"journal-article","created":{"date-parts":[[2010,12,1]],"date-time":"2010-12-01T20:18:10Z","timestamp":1291234690000},"page":"1-29","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":7,"title":["Scan-Cell Reordering for Minimizing Scan-Shift Power Based on Nonspecified Test Cubes"],"prefix":"10.1145","volume":"16","author":[{"given":"Yu-Ze","family":"Wu","sequence":"first","affiliation":[{"name":"National Chiao Tung University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mango C.-T.","family":"Chao","sequence":"additional","affiliation":[{"name":"National Chiao Tung University"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2010,11]]},"reference":[{"volume-title":"Proceedings of the Conference on Design, Automation, and Test in Europe (DATE\u201904)","author":"Bonhomme Y.","key":"e_1_2_1_1_1"},{"volume-title":"Proceedings of the IEEE International Test Conference. 796--803","author":"Bonhomme Y.","key":"e_1_2_1_2_1"},{"volume-title":"Proceedings of the IEEE Asian Test Symposium. 253--258","author":"Bonhomme Y.","key":"e_1_2_1_3_1"},{"volume-title":"Proceedings of the IEEE International Test Conference. 488--493","author":"Bonhomme Y.","key":"e_1_2_1_4_1"},{"key":"e_1_2_1_5_1","unstructured":"Bushnell M. and Agrawal V. 2000. 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