{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,19]],"date-time":"2025-11-19T11:27:32Z","timestamp":1763551652194,"version":"build-2065373602"},"publisher-location":"New York, NY, USA","reference-count":9,"publisher":"ACM","license":[{"start":{"date-parts":[[2011,3,21]],"date-time":"2011-03-21T00:00:00Z","timestamp":1300665600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["2009-00776592010-0016216"],"award-info":[{"award-number":["2009-00776592010-0016216"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2011,3,21]]},"DOI":"10.1145\/1982185.1982266","type":"proceedings-article","created":{"date-parts":[[2011,5,17]],"date-time":"2011-05-17T12:59:14Z","timestamp":1305637154000},"page":"374-379","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":41,"title":["A lifespan-aware reliability scheme for RAID-based flash storage"],"prefix":"10.1145","author":[{"given":"Sehwan","family":"Lee","sequence":"first","affiliation":[{"name":"Seoul National University, Seoul, Korea"}]},{"given":"Bitna","family":"Lee","sequence":"additional","affiliation":[{"name":"Seoul National University, Seoul, Korea"}]},{"given":"Kern","family":"Koh","sequence":"additional","affiliation":[{"name":"Seoul National University, Seoul, Korea"}]},{"given":"Hyokyung","family":"Bahn","sequence":"additional","affiliation":[{"name":"Ewha University, Seoul, Korea"}]}],"member":"320","published-online":{"date-parts":[[2011,3,21]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"\"Intel gets working samples of 25nm 3 bit per cell flash | Electronista.\" available at http:\/\/www.electronista.com\/articles\/10\/08\/17\/intels.25nm.3.bit.flash.ready.to.go\/  \"Intel gets working samples of 25nm 3 bit per cell flash | Electronista.\" available at http:\/\/www.electronista.com\/articles\/10\/08\/17\/intels.25nm.3.bit.flash.ready.to.go\/"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669118"},{"key":"e_1_3_2_1_3_1","first-page":"9","author":"Mielke N.","year":"2008","unstructured":"N. Mielke , T. Marquart , N. Wu , J. Kessenich , H. Belgal , E. Schares , F. Trivedi , E. Goodness , and L. R. Nevill , \"Bit Error Rate in NAND Flash Memories,\" Proc. IEEE Int'l Reliability Physics Symp. , 2008 , pp. 9 -- 19 . N. Mielke, T. Marquart, N. Wu, J. Kessenich, H. Belgal, E. Schares, F. Trivedi, E. Goodness, and L. R. Nevill, \"Bit Error Rate in NAND Flash Memories,\" Proc. IEEE Int'l Reliability Physics Symp., 2008, pp. 9--19.","journal-title":"\"Bit Error Rate in NAND Flash Memories,\" Proc. IEEE Int'l Reliability Physics Symp."},{"key":"e_1_3_2_1_4_1","first-page":"428","author":"Ds NAND","year":"2008","unstructured":"Li-Pin Chang, \"Hybrid Solid-State Disks: Combining Heterogeneous NAND Flash in Large SS Ds ,\" Asia and South Pacific Design Automation Conf. , 2008 , pp. 428 -- 433 . Li-Pin Chang, \"Hybrid Solid-State Disks: Combining Heterogeneous NAND Flash in Large SSDs,\" Asia and South Pacific Design Automation Conf., 2008, pp. 428--433.","journal-title":"Asia and South Pacific Design Automation Conf."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/1555754.1555760"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/1363686.1364094"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/1629435.1629459"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/MSST.2010.5496997"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1145\/1629395.1629416"}],"event":{"name":"SAC'11: The 2011 ACM Symposium on Applied Computing","sponsor":["SIGAPP ACM Special Interest Group on Applied Computing"],"location":"TaiChung Taiwan","acronym":"SAC'11"},"container-title":["Proceedings of the 2011 ACM Symposium on Applied Computing"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1982185.1982266","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1982185.1982266","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T10:52:20Z","timestamp":1750243940000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1982185.1982266"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3,21]]},"references-count":9,"alternative-id":["10.1145\/1982185.1982266","10.1145\/1982185"],"URL":"https:\/\/doi.org\/10.1145\/1982185.1982266","relation":{},"subject":[],"published":{"date-parts":[[2011,3,21]]},"assertion":[{"value":"2011-03-21","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}