{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:29:06Z","timestamp":1750307346350,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":34,"publisher":"ACM","license":[{"start":{"date-parts":[[2011,5,21]],"date-time":"2011-05-21T00:00:00Z","timestamp":1305936000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2011,5,21]]},"DOI":"10.1145\/1985793.1985800","type":"proceedings-article","created":{"date-parts":[[2011,5,24]],"date-time":"2011-05-24T13:04:30Z","timestamp":1306242270000},"page":"41-50","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":21,"title":["Towards quantitative software reliability assessment in incremental development processes"],"prefix":"10.1145","author":[{"given":"Toshiya","family":"Fujii","sequence":"first","affiliation":[{"name":"Hiroshima University, Higashi-Hiroshima, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tadashi","family":"Dohi","sequence":"additional","affiliation":[{"name":"Hiroshima University, Higashi-Hiroshima, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takaji","family":"Fujiwara","sequence":"additional","affiliation":[{"name":"Fujitsu Quality Laboratory, Kawasaki, Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2011,5,21]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1975.6312870"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1049\/ip-sen:20031056"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1049\/ip-sen:20050019"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1023\/A:1025809010217"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2005.46"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/2.59"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2005.303"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2010.50"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1979.5220566"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.5555\/1788594.1788615"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1147\/sj.331.0089"},{"key":"e_1_3_2_1_12_1","first-page":"381","volume-title":"Incremental Development - Terminology and Guidelines","author":"Karlsson E. A.","year":"2002","unstructured":"E. A. Karlsson . Ten fallacies of availability and reliability analysis . In Incremental Development - Terminology and Guidelines , Vol. 1 , pages 381 -- 401 . World Scientific , 2002 . E. A. Karlsson. Ten fallacies of availability and reliability analysis. In Incremental Development - Terminology and Guidelines, Vol.1, pages 381--401. World Scientific, 2002."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2003.1204375"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.5555\/257572.257575"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/52.268956"},{"key":"e_1_3_2_1_16_1","volume-title":"McGraw-Hill","author":"Lyu M. R.","year":"1996","unstructured":"M. R. Lyu . Handbook of Software Reliability Engineering . McGraw-Hill , New York , 1996 . M. R. Lyu. Handbook of Software Reliability Engineering. McGraw-Hill, New York, 1996."},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/MS.1987.231413"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1145\/1062455.1062516"},{"key":"e_1_3_2_1_19_1","volume-title":"Measurement, Prediction, Application","author":"Musa J. D.","year":"1987","unstructured":"J. D. Musa , A. Iannino , and K. Okumoto . Software Reliability , Measurement, Prediction, Application . McGraw-Hill , New York , 1987 . J. D. Musa, A. Iannino, and K. Okumoto. Software Reliability, Measurement, Prediction, Application. McGraw-Hill, New York, 1987."},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.5555\/800054.801975"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2010.14"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2009.03.036"},{"key":"e_1_3_2_1_23_1","unstructured":"H. Pham. Software Reliability. Springer-Verlag London 2000.   H. Pham. Software Reliability. Springer-Verlag London 2000."},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1198\/004017005000000292"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2006.68"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.5555\/100296.100297"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2006.28"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1109\/ESEM.2009.5316044"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1016\/0167-9236(95)00022-4"},{"key":"e_1_3_2_1_30_1","first-page":"187","volume-title":"Building Quality into Software","author":"Wohlin C.","year":"1994","unstructured":"C. Wohlin . Managing software quality through incremental development and certification . In Building Quality into Software , pages 187 -- 202 . Computational Mechanics Publications , 1994 . C. Wohlin. Managing software quality through incremental development and certification. In Building Quality into Software, pages 187--202. Computational Mechanics Publications, 1994."},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.5555\/851010.856097"},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0164-1212(99)00065-5"},{"key":"e_1_3_2_1_33_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1983.5221735"},{"key":"e_1_3_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0950-5849(98)00098-6"}],"event":{"name":"ICSE11: International Conference on Software Engineering","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering","IEEE CS"],"location":"Waikiki, Honolulu HI USA","acronym":"ICSE11"},"container-title":["Proceedings of the 33rd International Conference on Software Engineering"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1985793.1985800","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/1985793.1985800","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T11:06:29Z","timestamp":1750244789000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/1985793.1985800"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5,21]]},"references-count":34,"alternative-id":["10.1145\/1985793.1985800","10.1145\/1985793"],"URL":"https:\/\/doi.org\/10.1145\/1985793.1985800","relation":{},"subject":[],"published":{"date-parts":[[2011,5,21]]},"assertion":[{"value":"2011-05-21","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}