{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:26:02Z","timestamp":1750307162749,"version":"3.41.0"},"reference-count":20,"publisher":"Association for Computing Machinery (ACM)","issue":"4","license":[{"start":{"date-parts":[[2011,10,1]],"date-time":"2011-10-01T00:00:00Z","timestamp":1317427200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["ACM Trans. Des. Autom. Electron. Syst."],"published-print":{"date-parts":[[2011,10]]},"abstract":"<jats:p>Coverage is an important measure for the quality and completeness of the functional verification of hardware logic designs. Verification teams spend a significant amount of time looking for bugs in the design and in providing high-quality coverage. This process is performed through the use of various sampling strategies for selecting test inputs. The selection of sampling strategies to achieve the verification goals is typically carried out in an intuitive manner.<\/jats:p>\n          <jats:p>We studied several commonly used sampling strategies and provide a probabilistic framework for assessing and comparing their relative values. For this analysis, we derived results for two measures of interest: first, the probability of finding a bug within a given number of samplings; and second, the expected number of samplings until a bug is detected. These results are given for both recurring sampling schemes, in which the same inputs might be selected repeatedly, and for nonrecurring sampling schemes, in which already sampled inputs are never selected again.<\/jats:p>\n          <jats:p>By considering results from the theory of search, and more specifically, from the well-known multiarmed bandit problem, we demonstrate the optimality of a greedy sampling strategy within our defined framework.<\/jats:p>","DOI":"10.1145\/2003695.2003698","type":"journal-article","created":{"date-parts":[[2011,10,25]],"date-time":"2011-10-25T12:23:05Z","timestamp":1319545385000},"page":"1-20","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":6,"title":["A probabilistic analysis of coverage methods"],"prefix":"10.1145","volume":"16","author":[{"given":"Laurent","family":"Fournier","sequence":"first","affiliation":[{"name":"IBM Research - Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Avi","family":"Ziv","sequence":"additional","affiliation":[{"name":"IBM Research - Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ekaterina","family":"Kutsy","sequence":"additional","affiliation":[{"name":"Technion, Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ofer","family":"Strichman","sequence":"additional","affiliation":[{"name":"Technion, Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2011,10,27]]},"reference":[{"key":"e_1_2_2_1_1","first-page":"189","article-title":"Sampling techniques for determining fault coverage in LSI circuits","volume":"5","author":"Agrawal V.","year":"1981","unstructured":"Agrawal , V. 1981 . Sampling techniques for determining fault coverage in LSI circuits . J. Digital Syst. 5 , 3, 189 -- 202 . Agrawal, V. 1981. Sampling techniques for determining fault coverage in LSI circuits. J. Digital Syst. 5, 3, 189--202.","journal-title":"J. Digital Syst."},{"key":"e_1_2_2_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/54.57911"},{"volume-title":"Proceedings of the IEEE International High-Level Design Validation and Test (HLDVT). IEEE","author":"Aharoni M.","key":"e_1_2_2_3_1","unstructured":"Aharoni , M. , Asaf , S. , Fournier , L. , Koyfman , A. , and Nagel , R . 2003. FPgen\u2014a test-generation framework for datapath floating-point verification . In Proceedings of the IEEE International High-Level Design Validation and Test (HLDVT). IEEE , Los Alamitos, CA, 17--22. Aharoni, M., Asaf, S., Fournier, L., Koyfman, A., and Nagel, R. 2003. FPgen\u2014a test-generation framework for datapath floating-point verification. In Proceedings of the IEEE International High-Level Design Validation and Test (HLDVT). IEEE, Los Alamitos, CA, 17--22."},{"key":"e_1_2_2_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/309847.309912"},{"key":"e_1_2_2_5_1","unstructured":"Clarke E. M. Grumberg O. and Peled D. A. 1999. Model Checking. MIT Press Cambridge MA.   Clarke E. M. Grumberg O. and Peled D. A. 1999. Model Checking. MIT Press Cambridge MA."},{"key":"e_1_2_2_6_1","doi-asserted-by":"publisher","DOI":"10.1023\/A:1023796929359"},{"key":"e_1_2_2_7_1","unstructured":"Dechter R. 2003. Constraints Processing. Morgan Kaufmann.   Dechter R. 2003. Constraints Processing. Morgan Kaufmann."},{"key":"e_1_2_2_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775907"},{"volume-title":"Multi-Armed Bandit Allocation Indexes","author":"Gittins J.","key":"e_1_2_2_9_1","unstructured":"Gittins , J. 1989. Multi-Armed Bandit Allocation Indexes . Prentice-Hall , Englewood Cliffs, NJ . Gittins, J. 1989. 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Comprehensive Functional Verification\u2014The Complete Industry Cycle. Elsevier Amsterdam.   Wile B. Goss J. C. and Roesner W. 2005. Comprehensive Functional Verification\u2014The Complete Industry Cycle. 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