{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:25:19Z","timestamp":1750307119406,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":0,"publisher":"ACM","license":[{"start":{"date-parts":[[2011,8,30]],"date-time":"2011-08-30T00:00:00Z","timestamp":1314662400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2011,8,30]]},"DOI":"10.1145\/2020876.2020929","type":"proceedings-article","created":{"date-parts":[[2011,8,31]],"date-time":"2011-08-31T15:22:45Z","timestamp":1314804165000},"page":"228-228","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Noise and reliability in advanced CMOS devices for low power applications"],"prefix":"10.1145","author":[{"given":"Purushothaman","family":"Srinivasan","sequence":"first","affiliation":[{"name":"Texas Instruments, Dallas, TX, USA"}]}],"member":"320","published-online":{"date-parts":[[2011,8,30]]},"event":{"sponsor":["SBMicro","IEEE ICAS","IEEE Circuits and Systems Society","SBC","SIGDA ACM Special Interest Group on Design Automation"],"acronym":"SBCCI '11","name":"SBCCI '11: 24th Symposium on Integrated Circuits and Systems Design","location":"Jo\u00e3o Pessoa Brazil"},"container-title":["Proceedings of the 24th symposium on Integrated circuits and systems design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2020876.2020929","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2020876.2020929","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T09:48:22Z","timestamp":1750240102000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2020876.2020929"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,8,30]]},"references-count":0,"alternative-id":["10.1145\/2020876.2020929","10.1145\/2020876"],"URL":"https:\/\/doi.org\/10.1145\/2020876.2020929","relation":{},"subject":[],"published":{"date-parts":[[2011,8,30]]},"assertion":[{"value":"2011-08-30","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}