{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:38:08Z","timestamp":1761647888394,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":25,"publisher":"ACM","license":[{"start":{"date-parts":[[2011,6,5]],"date-time":"2011-06-05T00:00:00Z","timestamp":1307232000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["916828"],"award-info":[{"award-number":["916828"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2011,6,5]]},"DOI":"10.1145\/2024724.2024740","type":"proceedings-article","created":{"date-parts":[[2011,9,6]],"date-time":"2011-09-06T15:10:46Z","timestamp":1315321846000},"page":"65-70","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":19,"title":["To DFM or not to DFM?"],"prefix":"10.1145","author":[{"given":"Wing Chiu","family":"Tam","sequence":"first","affiliation":[{"name":"Carnegie Mellon University, Pittsburgh, PA"}]},{"given":"Shawn","family":"Blanton","sequence":"additional","affiliation":[{"name":"Carnegie Mellon University, Pittsburgh, PA"}]}],"member":"320","published-online":{"date-parts":[[2011,6,5]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"crossref","unstructured":"V. Pitchumani \"A Hitchhiker's Guide to the DFM Universe \" IEEE Asia Pacific Conference on Circuits and Systems pp. 1103--1106 2006. V. Pitchumani \"A Hitchhiker's Guide to the DFM Universe \" IEEE Asia Pacific Conference on Circuits and Systems pp. 1103--1106 2006.","DOI":"10.1109\/APCCAS.2006.342314"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065779"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065783"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"crossref","unstructured":"S. Wei etal \"To DFT or not to DFT? \" International Test Conference pp. 557--566 1997. S. Wei et al. \"To DFT or not to DFT? \" International Test Conference pp. 557--566 1997.","DOI":"10.1109\/TEST.1997.639664"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.37"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.74"},{"key":"e_1_3_2_1_7_1","first-page":"1","volume-title":"International Test Conference","author":"Dongok K.","year":"2007"},{"key":"e_1_3_2_1_8_1","first-page":"206","volume-title":"VLSI Test Symposium","author":"Dongok K.","year":"2010"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/66.136275"},{"key":"e_1_3_2_1_10_1","first-page":"1","author":"Desineni R.","year":"2006","journal-title":"\"A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior,\" International Test Conference"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391568"},{"key":"e_1_3_2_1_12_1","first-page":"273","author":"Wasserman L.","year":"2004","journal-title":"Springer"},{"key":"e_1_3_2_1_13_1","first-page":"143","author":"Wasserman L.","year":"2004","journal-title":"Springer"},{"key":"e_1_3_2_1_14_1","first-page":"89","author":"Wasserman L.","year":"2004","journal-title":"Springer"},{"key":"e_1_3_2_1_15_1","first-page":"321","author":"Wasserman L.","year":"2004","journal-title":"Springer"},{"key":"e_1_3_2_1_16_1","first-page":"226","volume":"19","author":"Maly W.","year":"1983","journal-title":"\"Yield Estimation Model for VLSI Artwork Evaluation,\" Electronics Letters"},{"key":"e_1_3_2_1_17_1","first-page":"337","author":"Wasserman L.","year":"2004","journal-title":"Springer"},{"volume-title":"CA.: PDF Solutions Inc.","year":"2001","author":"SiCat User Manual The","key":"e_1_3_2_1_18_1"},{"volume-title":"OR.: Mentor Graphics Corporation","year":"2008","author":"Analyzer User Manual The Calibre","key":"e_1_3_2_1_19_1"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"crossref","unstructured":"P. L. C. Simon etal \"Design Dependency of Yield Loss due to Tungsten Residues in Spin on Glass based Planarization Processes \" International Symposium on Semiconductor Manufacturing pp. 87--90 1997. P. L. C. Simon et al. \"Design Dependency of Yield Loss due to Tungsten Residues in Spin on Glass based Planarization Processes \" International Symposium on Semiconductor Manufacturing pp. 87--90 1997.","DOI":"10.1109\/ISSM.1997.664631"},{"key":"e_1_3_2_1_21_1","first-page":"209","volume-title":"Interconnect Technology Conference","author":"Leduc P.","year":"2005"},{"key":"e_1_3_2_1_22_1","first-page":"127","author":"Wasserman L.","year":"2004","journal-title":"Springer"},{"key":"e_1_3_2_1_23_1","unstructured":"http:\/\/faculty.chass.ncsu.edu\/garson\/PA765\/assocnominal.htm http:\/\/faculty.chass.ncsu.edu\/garson\/PA765\/assocnominal.htm"},{"key":"e_1_3_2_1_24_1","unstructured":"\"The Tetramax User Guide \" ed. Mountain View CA.: Synopsys Inc. 2009. \"The Tetramax User Guide \" ed. Mountain View CA.: Synopsys Inc. 2009."},{"volume-title":"OR.: Mentor Graphics Corporation","year":"2009","author":"Verification User Manual The Calibre","key":"e_1_3_2_1_25_1"}],"event":{"name":"DAC '11: The 48th Annual Design Automation Conference 2011","sponsor":["EDAC Electronic Design Automation Consortium","SIGDA ACM Special Interest Group on Design Automation","IEEE Council on Electronic Design Automation (CEDA)"],"location":"San Diego California","acronym":"DAC '11"},"container-title":["Proceedings of the 48th Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2024724.2024740","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2024724.2024740","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T09:54:14Z","timestamp":1750240454000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2024724.2024740"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,6,5]]},"references-count":25,"alternative-id":["10.1145\/2024724.2024740","10.1145\/2024724"],"URL":"https:\/\/doi.org\/10.1145\/2024724.2024740","relation":{},"subject":[],"published":{"date-parts":[[2011,6,5]]},"assertion":[{"value":"2011-06-05","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}