{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:28:50Z","timestamp":1750307330845,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":34,"publisher":"ACM","license":[{"start":{"date-parts":[[2011,6,5]],"date-time":"2011-06-05T00:00:00Z","timestamp":1307232000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2011,6,5]]},"DOI":"10.1145\/2024724.2024885","type":"proceedings-article","created":{"date-parts":[[2011,9,6]],"date-time":"2011-09-06T15:10:46Z","timestamp":1315321846000},"page":"712-717","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":2,"title":["Single-molecule electronic detection using nanoscale field-effect devices"],"prefix":"10.1145","author":[{"given":"Sebastian","family":"Sorgenfrei","sequence":"first","affiliation":[{"name":"Columbia University, New York, NY"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kenneth","family":"Shepard","sequence":"additional","affiliation":[{"name":"Columbia University, New York, NY"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2011,6,5]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.270.5235.467"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"crossref","first-page":"129","DOI":"10.4049\/jimmunol.109.1.129","article-title":"Enzyme-Linked Immunosorbent Assay, Elisa","volume":"109","author":"Engvall E.","year":"1972","unstructured":"E. Engvall and P. Perlmann , \" Enzyme-Linked Immunosorbent Assay, Elisa ,\" The Journal of Immunology , vol. 109 , pp. 129 -- 135 , July 1, 1972 1972. E. Engvall and P. Perlmann, \"Enzyme-Linked Immunosorbent Assay, Elisa,\" The Journal of Immunology, vol. 109, pp. 129--135, July 1, 1972 1972.","journal-title":"The Journal of Immunology"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1038\/nbt896"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2008.10.012"},{"key":"e_1_3_2_1_5_1","first-page":"350","article-title":"Sensor arrays for fully-electronic DNA detection on CMOS","author":"Thewes R.","year":"2002","unstructured":"R. Thewes , , \" Sensor arrays for fully-electronic DNA detection on CMOS ,\" IEEE International Solid-State Circuits Conference , pp. 350 -- 351 , 2002 . R. Thewes, et al., \"Sensor arrays for fully-electronic DNA detection on CMOS,\" IEEE International Solid-State Circuits Conference, pp. 350--351, 2002.","journal-title":"IEEE International Solid-State Circuits Conference"},{"key":"e_1_3_2_1_6_1","first-page":"488","volume-title":"IEDM '02","author":"Hofmann F.","year":"2002","unstructured":"F. Hofmann , DNA detection on a CMOS chip: device and process issues,\" in Electron Devices Meeting, 2002 . IEDM '02 . Digest. International , 2002 , pp. 488 -- 491 . F. Hofmann, et al., \"Fully electronic DNA detection on a CMOS chip: device and process issues,\" in Electron Devices Meeting, 2002. IEDM '02. Digest. International, 2002, pp. 488--491."},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.837084"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2006.1696291"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.bios.2006.06.024"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2005.06.069"},{"key":"e_1_3_2_1_11_1","first-page":"169","volume-title":"ISCAS 2002. IEEE International Symposium on","author":"Purushothaman S.","year":"2002","unstructured":"S. Purushothaman , fast solid state DNA sequencing,\" in Circuits and Systems, 2002 . ISCAS 2002. IEEE International Symposium on , 2002 , pp. IV- 169 -IV-172 vol.4. S. Purushothaman, et al., \"Towards fast solid state DNA sequencing,\" in Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium on, 2002, pp. IV-169-IV-172 vol.4."},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1146\/annurev.biochem.77.061906.092014"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.283.5408.1689"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0079-6107(00)00017-1"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2007.27"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2008.2003438"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1135303"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2010.275"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl025639a"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl034139u"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.0504146103"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2010.275"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.physa.2005.01.013"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.0908077106"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.bpj.2009.09.031"},{"key":"e_1_3_2_1_26_1","first-page":"28.2.1","volume-title":"2010 IEEE International","author":"Realov S.","year":"2010","unstructured":"S. Realov and K. L. Shepard , \" Random telegraph noise in 45-nm CMOS: Analysis using an on-chip test and measurement system,\" in Electron Devices Meeting (IEDM) , 2010 IEEE International , 2010 , pp. 28.2.1 -- 28.2.4 . S. Realov and K. L. Shepard, \"Random telegraph noise in 45-nm CMOS: Analysis using an on-chip test and measurement system,\" in Electron Devices Meeting (IEDM), 2010 IEEE International, 2010, pp. 28.2.1--28.2.4."},{"key":"e_1_3_2_1_27_1","first-page":"1","volume-title":"2009 IEEE International","author":"Nagumo T.","year":"2009","unstructured":"T. Nagumo , analysis methods for comprehensive understanding of Random Telegraph Noise,\" in Electron Devices Meeting (IEDM) , 2009 IEEE International , 2009 , pp. 1 -- 4 . T. Nagumo, et al., \"New analysis methods for comprehensive understanding of Random Telegraph Noise,\" in Electron Devices Meeting (IEDM), 2009 IEEE International, 2009, pp. 1--4."},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl073271h"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1116\/1.2800322"},{"key":"e_1_3_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl0342343"},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl802779t"},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2007.77"},{"key":"e_1_3_2_1_33_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3077620"},{"key":"e_1_3_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl0703727"}],"event":{"name":"DAC '11: The 48th Annual Design Automation Conference 2011","sponsor":["EDAC Electronic Design Automation Consortium","SIGDA ACM Special Interest Group on Design Automation","IEEE Council on Electronic Design Automation (CEDA)"],"location":"San Diego California","acronym":"DAC '11"},"container-title":["Proceedings of the 48th Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2024724.2024885","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2024724.2024885","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T11:06:07Z","timestamp":1750244767000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2024724.2024885"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,6,5]]},"references-count":34,"alternative-id":["10.1145\/2024724.2024885","10.1145\/2024724"],"URL":"https:\/\/doi.org\/10.1145\/2024724.2024885","relation":{},"subject":[],"published":{"date-parts":[[2011,6,5]]},"assertion":[{"value":"2011-06-05","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}